2002
DOI: 10.1002/sia.1290
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Quantitative AES depth profiling of iron and chromium oxides in solid solution, (Cr1−xFex)2O3

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Cited by 17 publications
(8 citation statements)
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“…Since the sensitivity factors for oxygen in Cr 2 O 3 and Fe 2 O 3 are different from that for Al 2 O 3 the oxygen signal will be slightly off when mixtures of the oxides are present [19].…”
Section: Auger Electron Spectroscopy Aesmentioning
confidence: 99%
“…Since the sensitivity factors for oxygen in Cr 2 O 3 and Fe 2 O 3 are different from that for Al 2 O 3 the oxygen signal will be slightly off when mixtures of the oxides are present [19].…”
Section: Auger Electron Spectroscopy Aesmentioning
confidence: 99%
“…Since the sensitivity factor for oxygen in Cr 2 O 3 and Fe 2 O 3 are different from that for Al 2 O 3 , the oxygen signal will be slightly off when mixtures of the oxides are present [19]. The computer software PHI-Matlab and linear least square (LLS) routines were used to separate the oxide and metal components in the depth profiles.…”
Section: Ion Chromatography Icmentioning
confidence: 99%
“…10 molar fraction. 30 The main advantage of using AES is the possibility of conducting depth profiling for oxide thickness determination in selected areas even on powder samples. Figure 4 shows a typical depth profile recorded in this manner from a single particle of the high Cr material.…”
Section: Aesmentioning
confidence: 99%