2017
DOI: 10.1088/1555-6611/aa962b
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Quantitative analysis of a brass alloy using CF-LIBS and a laser ablation time-of-flight mass spectrometer

Abstract: We present a quantitative analysis of a brass alloy using laser induced breakdown spectroscopy, energy dispersive x-ray spectroscopy (EDX) and laser ablation time-of-flight mass spectrometry (LA-TOF-MS). The emission lines of copper (Cu I) and zinc (Zn I), and the constituent elements of the brass alloy were used to calculate the plasma parameters. The plasma temperature was calculated from the Boltzmann plot as (10 000 ± 1000) K and the electron number density was determined as (2.0 ± 0.5) × 10 17 cm −3 from … Show more

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Cited by 22 publications
(7 citation statements)
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“…Several authors [13,16,17] have used the Wiley-McLaren type instrument to investigate the samples by employing TOF-MS. The problem associated with the Wiley-McLaren design is the KE spread and spatial distribution of the ions produced in the laser plasma.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Several authors [13,16,17] have used the Wiley-McLaren type instrument to investigate the samples by employing TOF-MS. The problem associated with the Wiley-McLaren design is the KE spread and spatial distribution of the ions produced in the laser plasma.…”
Section: Resultsmentioning
confidence: 99%
“…(3) There is no interference effect due to the buffer gas and different matrix as was the case in inductively coupled plasma mass spectrometry. Laser ablation of metals has been explored by many researchers using TOF-MS [12][13][14][15][16][17][18]. The main hindrances regarding the mass resolution in TOF-MS are, the dispersion in the initial energies, and the movement of charged particles in several directions, having an equal mass-to-charge ratio (m/z).…”
Section: Introductionmentioning
confidence: 99%
“…The term values on the left side of equation (2) are determined using the recorded line intensities, while the right side of the equation contains the spectroscopic parameters of lines whose values are obtained from the NIST database. To verify the condition of optically thin plasma, spectral lines with a common upper energy level or close-lying energy levels were used to minimize temperature dependence [34] . The spectroscopic parameters of Ca, Si, Mg, and Fe were used in equation (2) to calculate the ratio of the line intensities, as given in Table 2 .…”
Section: Resultsmentioning
confidence: 99%
“…Furthermore, according to the condition (i) mentioned in the theory section above, the selected spectral lines should be free from self-absorption. Based on earlier reports, 4,5,[21][22][23] five emission lines of Cu (465.18, 510.55, 515.38, 521.86, and 570.00 nm) and two emission lines of Zn (328.25 and 330.29 nm) were chosen for this study as they reported to be free from the selfabsorption effect. The spectroscopic parameters of these seven emission lines are taken from the NIST Atomic Database and presented in Table I.…”
Section: Intensity Ratio Model For the Estimation Of T M And τmentioning
confidence: 99%