1954
DOI: 10.1021/ac60089a004
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Quantitative Analysis of Niobium and Tantalum in Ores by Fluorescent X-Ray Spectroscopy

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1956
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Cited by 46 publications
(10 citation statements)
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“…successive dilutions) to improve the accuracy of the measurement. 61 According to the IUPAC document, when the linearity of the calibration curve could be ensured, a single level addition could be applied to the SAM for quantitative analysis. 32 Therefore, single level addition SAM could be a practical approach for ICP-MS analysis, by taking into consideration the fact that the majorities of present commercial ICP-MS instruments could provide signal intensities for the elements covering a linearity range of even over nine orders of magnitude.…”
Section: Introductionmentioning
confidence: 99%
“…successive dilutions) to improve the accuracy of the measurement. 61 According to the IUPAC document, when the linearity of the calibration curve could be ensured, a single level addition could be applied to the SAM for quantitative analysis. 32 Therefore, single level addition SAM could be a practical approach for ICP-MS analysis, by taking into consideration the fact that the majorities of present commercial ICP-MS instruments could provide signal intensities for the elements covering a linearity range of even over nine orders of magnitude.…”
Section: Introductionmentioning
confidence: 99%
“…Kelly et al discussed the priority for the use of SAM beyond the field of polarography noting its use in emission spectrography by Harvey, reported in 1950 [17]. However, their analysis of priority between Campbell and Carl’s use in X-ray fluorescence (1954) [18] and Chow and Thompson’s use in flame photometry (1955) [19] is rendered pointless in the light of Chow and Thompson’s reference to Smales [20] (their reference [10]). The incorrect priority given to Chow and Thompson’s work was first stated in 2008 [21].…”
Section: Methods Of Standard Additionsmentioning
confidence: 99%
“…As pointed out in the authors' original paper (5), the determination of low concentrations of tantalum oxide was restricted because of low intensities and insufficient resolution of interfering spectral lines. At that time the only practical solution to the interference problem was to excite the tantalum spectrum at 18 kv., a value below the critical voltage for the niobium K spectrum (£).…”
Section: Instrumentationmentioning
confidence: 99%
“…The analysis of niobium and tantalum ores has been performed successfully by fluorescent x-ray spectrographic methods (5,7), and recently both equipment and techniques have been considerably improved. Therefore, a rather intensive study of the effects of impurities and sample preparation on the x-ray spectrographic method was undertaken.…”
mentioning
confidence: 99%