2024
DOI: 10.35848/1347-4065/ad3da0
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Quantitative analysis of optical emission spectroscopy for plasma process monitoring

Hiroshi Akatsuka

Abstract: Plasma parameters should be evaluated to control the plasma process adequately with non-invasive method, one of which is the optical emission spectroscopy (OES) measurement. Some OES studies are reviewed to measure electron density N e, electron temperature T e and electron energy distribution function (EEDF) of argon plasma with low-electron temperature (T e ∼ 1−10 eV) under not only low-pressure condition but also atmospheric-pressure discharge. The basic… Show more

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