Quantitative Analysis of Scanning Force Microscopy Images of Nickel-Based Superalloys

Abstract

Résumé. 2014 Cet article présente des travaux récents visant à tester le potentiel de

Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles

“…The only difference is that the two half-axes α and β are the same. The γ'-precipitates in advanced nickel based superalloys are such rounded cubes [2,[7][8][9]. In-plane γ-pits yield only ancillary information: they show possible deviations of the plate-shaped γ-precipitates from a four-fold rotational symmetry around the shorter axis (see section 4.1.2).…”

“…To characterise plate-shaped precipitates at least two parameters are required: some linear measure 2a of their average areal extension and their average thickness 2b. In addition, the distribution functions Φ of the individual particle radius i ρ , the cube length i δ , the areal extension α i 2 , and the thickness β i cost, more recently they too have been used to determine the size and the volume fraction of spherical and cubic particles [7][8][9][10][11][12][13]. Moreover in contrast to the TEM, also compact specimens can be investigated in the AFM, which facilitates the preparation of the specimens, and thanks to the direct three-dimensional digital output automated computer based evaluation procedures can readily be applied.…”