1992
DOI: 10.1016/0739-6260(92)90072-l
|View full text |Cite
|
Sign up to set email alerts
|

Quantitative analysis of sputtering due to ion beam bombardment of solids and biological specimens in high resolution electron microscopy

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

1992
1992
2007
2007

Publication Types

Select...
3
1

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(2 citation statements)
references
References 17 publications
0
2
0
Order By: Relevance
“…After the fixative had been replaced with PBS, the specimens were dehydrated in graded ethanol and dried in a liquid CO 2 freeze-drying device (JFD-300, JEOL). Each segment was etched by the ion-beam bombardment method to allow visual inspection 12 and was processed further for scanning electron microscopy.…”
Section: Scanning Electron Microscopymentioning
confidence: 99%
“…After the fixative had been replaced with PBS, the specimens were dehydrated in graded ethanol and dried in a liquid CO 2 freeze-drying device (JFD-300, JEOL). Each segment was etched by the ion-beam bombardment method to allow visual inspection 12 and was processed further for scanning electron microscopy.…”
Section: Scanning Electron Microscopymentioning
confidence: 99%
“…Ion milling is routinely used in many microscopy-related applications, such as transmission electron microscopy (TEM) specimen thinning, surface cleaning for Auger analysis and in secondary ion mass spectroscopy (SIMS). Ion beam techniques have been used for the removal of surface layers from biological material to reveal underlying features (Kanaya et al, 1982(Kanaya et al, , 1992aYonehara et al, 1989). These ,studies generally use an ion beam in the micrometres to millimetres diameter range, extracted from a gas discharge (Brown, 1989), and etch relatively large areas of the specimen.…”
Section: Focused Ion Millingmentioning
confidence: 99%