Quantitative assessment of contact and non-contact lateral force calibration methods for atomic force microscopy

Khac, Bien Cuong Tran; Chung, Koo–Hyun

doi:10.1016/j.ultramic.2015.10.028

Cited by 19 publications

(8 citation statements)

References 39 publications

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“…In FFM measurements, an ultra-nanocrystalline diamond tip (NaDiaProbes, Advanced Diamond Technologies) with tip radius of about 40 nm was scanned across the surfaces of these specimens via contact-mode AFM. For the quantitative force measurements using AFM, normal [43] and lateral [44] force calibrations were performed prior to FFM measurements. The force calibration results showed that the normal spring constant and lateral force sensitivity of the diamond tip used for FFM measurements were about 0.15 N/m and 1.04 mV/nN, respectively.…”

Section: Methodsmentioning

confidence: 99%

Operational and environmental conditions regulate the frictional behavior of two-dimensional materials

Tran-Khac

Kim

DelRio

et al. 2019

Applied Surface Science

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The friction characteristics of single-layer h-BN, MoS2, and graphene were systematically investigated via friction force microscopy measurements at various operational (e.g., normal force and sliding speed) and environmental (e.g., relative humidity and thermal annealing) conditions. The low friction characteristics of these single-layer materials were clearly observed from the normal force-dependent friction results, and their interfacial shear strengths were further estimated using a Hertz-plus-offset model. In addition, speed-dependent friction characteristics clearly demonstrated two regimes of friction as a function of sliding speed – the first is the logarithmic increase in friction with sliding speed regime at sliding speeds smaller than the critical speed and the second is the friction plateau regime at sliding speeds greater than the critical speed. Fundamental parameters such as effective shape of the interaction potential and its corrugation amplitude for these single-layer materials were characterized using the thermally-activated Prandtl-Tomlinson model. Moreover, friction of single-layer h-BN, MoS2, and graphene was found to increase with relative humidity and decrease with thermal annealing; these trends were attributed to the diffusion of water molecules to the interface between the single-layer materials and their substrates, which leads to an increase in the puckering effect at the tip-material interface and interaction potential corrugation. The enhanced puckering effect was verified via molecular dynamics simulations. Overall, the findings enable a comprehensive understanding of friction characteristics for several classes of two-dimensional materials, which is important to elucidate the feasibility of using these materials as protective and solid-lubricant coating layers for nanoscale devices.

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Section: Methodsmentioning

confidence: 99%

Operational and environmental conditions regulate the frictional behavior of two-dimensional materials

Tran-Khac

Kim

DelRio

et al. 2019

Applied Surface Science

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“…A nanocrystalline diamond tip (NaDiaProbes, Advanced Diamond Technologies) with a tip radius of about 40 nm was used in both the progressive-force and constant-force tests. For the quantitative determination of the normal and friction forces, the cantilevers were calibrated in both normal 70 and lateral 71,72 directions. On the basis of the force calibration results, the normal spring constant and lateral sensitivity of the diamond probe used for scratch tests were about 45 N/m and 0.02 mV/nN, respectively.…”

Section: Methodsmentioning

confidence: 99%

Interfacial Strength and Surface Damage Characteristics of Atomically Thin h-BN, MoS₂, and Graphene

Khac

DelRio

Chung

2018

ACS Appl. Mater. Interfaces

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Surface damage characteristics of single- and multilayer hexagonal boron nitride (h-BN), molybdenum disulfide (MoS), and graphene films were systematically investigated via atomic force microscopy (AFM)-based progressive-force and constant-force scratch tests and Raman spectroscopy. The film-to-substrate interfacial strengths of these atomically thin films were assessed based on their critical forces (i.e., the normal force where the atomically thin film was delaminated from the underlying substrate), as determined from progressive-force scratch tests. The evolution of surface damage with respect to normal force was further investigated using constant-force tests. The results showed that single-layer h-BN, MoS, and graphene strongly adhere to the SiO substrate, which significantly improves its tribological performance. Moreover, defect formation induced by scratch testing was found to affect the topography and friction force differently prior to failure, which points to distinct surface damage characteristics. Interestingly, the residual strains at scratched areas suggest that the scratch test-induced in-plane compressive strains were dominant over tensile strains, thereby leading to buckling in front of the scratching tip and eventually failure at sufficient strains. These trends represent the general failure mechanisms of atomically thin materials because of a scratch test. As the number of layers increased, the tribological performances of atomically thin h-BN, MoS, and graphene were found to significantly improve because of an increase in the interfacial strengths and a decrease in the surface damage and friction force. In all, the findings on the distinctive surface damage characteristics and general failure mechanisms are useful for the design of reliable, protective and solid-lubricant coating layers based on these materials for nanoscale devices.

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“…Silicon probes with a nominal spring constant of 0.2 N/m (LFMR, Nanosensors) were used for contact mode imaging. For quantitative force measurement, normal and lateral force calibrations were performed prior to contact mode imaging. The normal force for contact mode imaging was initially set to 0.5 nN to minimize damage to the AFM probe and specimens during measurements.…”

Section: Methodsmentioning

confidence: 99%

Laser-Induced Particle Adsorption on Atomically Thin MoS₂

Khac

Jeon

Choi

et al. 2016

ACS Appl. Mater. Interfaces

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Atomically thin molybdenum disulfide (MoS2) shows great potential for use in nanodevices because of its remarkable electronic, optoelectronic, and mechanical properties. These material properties are often dependent on the thickness or the number of layers, and hence Raman spectroscopy is widely used to characterize the thickness of atomically thin MoS2 due to the sensitivity of the vibrational spectrum to thickness. However, the lasers used in Raman spectroscopy can increase the local surface temperature and eventually damage the upper layers of the MoS2, thereby changing the aforementioned material properties. In this work, the effects of lasers on the topography and material properties of atomically thin MoS2 were systematically investigated using Raman spectroscopy and atomic force microscopy. In detail, friction force microscopy was used to study the friction characteristics of atomically thin MoS2 as a function of laser powers from 0.5 to 20 mW and number of layers from 1 to 3. It was found that particles formed on the top surface of the atomically thin MoS2 due to laser-induced thermal effects. The degree of particle formation increased as the laser power increased, prior to the thinning of the atomically thin MoS2. In addition, the degree of particle formation increased as the number of MoS2 layers increased, which suggests that the thermal behavior of the supported MoS2 may differ depending on the number of layers. The particles likely originated from the atmosphere due to laser-induced heating, but could be eliminated via appropriate laser powers and exposure times, which were determined experimentally. The outcomes of this work indicate that thermal management is crucial in the design of reliable nanoscale devices based on atomically thin MoS2.

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Quantitative assessment of contact and non-contact lateral force calibration methods for atomic force microscopy

Cited by 19 publications

References 39 publications

Operational and environmental conditions regulate the frictional behavior of two-dimensional materials

Operational and environmental conditions regulate the frictional behavior of two-dimensional materials

Interfacial Strength and Surface Damage Characteristics of Atomically Thin h-BN, MoS₂, and Graphene

Laser-Induced Particle Adsorption on Atomically Thin MoS₂

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Quantitative assessment of contact and non-contact lateral force calibration methods for atomic force microscopy

Cited by 19 publications

References 39 publications

Operational and environmental conditions regulate the frictional behavior of two-dimensional materials

Operational and environmental conditions regulate the frictional behavior of two-dimensional materials

Interfacial Strength and Surface Damage Characteristics of Atomically Thin h-BN, MoS2, and Graphene

Laser-Induced Particle Adsorption on Atomically Thin MoS2

Contact Info

Product

Resources

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Interfacial Strength and Surface Damage Characteristics of Atomically Thin h-BN, MoS₂, and Graphene

Laser-Induced Particle Adsorption on Atomically Thin MoS₂