2010
DOI: 10.1007/s11661-010-0475-0
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Quantitative Atomic Force Microscopy Characterization and Crystal Plasticity Finite Element Modeling of Heterogeneous Deformation in Commercial Purity Titanium

Abstract: Using a four-point bend sample of commercial purity titanium deformed to a surface strain around 1.5 pct, the active dislocation slip and twin systems in a microstructural patch of about 15 grains were quantitatively analyzed by a technique combining atomic force microscopy (AFM), backscattered electron (BSE) imaging, and electron backscattered diffraction (EBSD). Local shear distribution maps derived from z-displacement data measured by AFM were directly compared to results of a crystal plasticity finite elem… Show more

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Cited by 61 publications
(20 citation statements)
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“…This microstructural patch has been modeled using crystal plasticity finite element simulations, using two microstructure geometries, including a columnar microstructure based on an OIM map. Clearly such a columnar geometry is not realistic, but it is convenient, and simulations provide rough agreement with experimental observations (see [39]). Recently, this microstructure was characterized non-destructively in three dimensions using differential aperture X-ray microscopy (DAXM), which provides crystal orientation information at about 1 µm spatial resolution up to depths of about 100-200 µm [55].…”
Section: Slip Transfer In Hexagonal Metalsmentioning
confidence: 99%
See 1 more Smart Citation
“…This microstructural patch has been modeled using crystal plasticity finite element simulations, using two microstructure geometries, including a columnar microstructure based on an OIM map. Clearly such a columnar geometry is not realistic, but it is convenient, and simulations provide rough agreement with experimental observations (see [39]). Recently, this microstructure was characterized non-destructively in three dimensions using differential aperture X-ray microscopy (DAXM), which provides crystal orientation information at about 1 µm spatial resolution up to depths of about 100-200 µm [55].…”
Section: Slip Transfer In Hexagonal Metalsmentioning
confidence: 99%
“…In-situ tensile deformation in scanning electron microscopy has also been carried out using pre-polished samples with a gage length of 10 mm and a 2 × 3 mm 2 cross section. The details of sample preparation and deformation are provided in [37][38][39][40][41].…”
Section: Experimental Descriptionmentioning
confidence: 99%
“…A technique combining AFM and EBSD-based trace analysis was recently developed to quantitatively measure the local dislocation shear activity associated with activated deformation systems in different grains. 14 Figure 3 displays a high magnification BSE image of an example of dislocation slip lines, as well as an AFM image of the same area measuring the surface height change due to the slip lines.…”
Section: Experimental Assessmentmentioning
confidence: 99%
“…While both of the above approaches generate heterogeneous deformation in different parts of a given grain that is similar to experimental observations, the agreement between such models and experimental measurements with the same grain sizes and textures has not been fully convincing. For example, comparisons between experimental measurements of activated SS and simulations of the same (usually simplified) microstructure often show good agreement about which SS are activated, but the agreement is worse in regions near GBs and triple points (Yang et al, 2011;Lim et al, 2015). One reason for these differences is that the finite element model intrinsically provides no properties of GBs and heterogeneous deformation arises from the discontinuity in properties on either side of the boundary.…”
Section: Introductionmentioning
confidence: 99%