2014
DOI: 10.1021/ac402753j
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Quantitative Compositional Profiling of Conjugated Quantum Dots with Single Atomic Layer Depth Resolution via Time-of-Flight Medium-Energy Ion Scattering Spectroscopy

Abstract: We report the quantitative compositional profiling of 3-5 nm CdSe/ZnS quantum dots (QDs) conjugated with a perfluorooctanethiol (PFOT) layer using the newly developed time-of-flight (TOF) medium-energy ion scattering (MEIS) spectroscopy with single atomic layer resolution. The collection efficiency of TOF-MEIS is 3 orders of magnitude higher than that of conventional MEIS, enabling the analysis of nanostructured materials with minimized ion beam damage and without ion neutralization problems. The spectra were … Show more

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Cited by 22 publications
(32 citation statements)
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“…Thus, it has been widely applied for ultrathin film characterization, especially for gate oxide analysis to determine their composition, thickness, and interface profile . MEIS has also been recently used to measure the size, composition, and core and shell structures of nanoparticles …”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…Thus, it has been widely applied for ultrathin film characterization, especially for gate oxide analysis to determine their composition, thickness, and interface profile . MEIS has also been recently used to measure the size, composition, and core and shell structures of nanoparticles …”
Section: Introductionmentioning
confidence: 99%
“…2,3 MEIS has also been recently used to measure the size, composition, and core and shell structures of nanoparticles. 4 The increasing popularity of MEIS has led to a growth in the need for investigating the consistency among MEIS results obtained under on different operating conditions, such as incident ion species (eg, H + and He + ), ion energy range, and energy analyzer type (eg, toroidal electrostatic type, magnetic sector type, and time-of-flight [TOF] type). Hence, a round-robin test (RRT) was conducted to investigate the consistency of the quantitative elemental composition and the thickness of ultrathin films determined by MEIS under different conditions.…”
Section: Introductionmentioning
confidence: 99%
“…The emergence of time-of-flight medium-energy-ion-scattering (TOF-MEIS) spectroscopy presents new opportunities for exploring nucleation and the growth mechanism of inorganic materials via quantitative depth profiling with single-atomic-layer resolution. 13 Compared to conventional MEIS based on a toroidal electrostatic energy analyzer with angular and energy dispersion that has been used to investigate elemental and structural depth profiles in nanomaterials, the collection efficiency of TOF-MEIS is significantly improved by more than 3 orders by using a large delay line detector with 120 mm diameter eliminating angular and energy dispersion, which minimizes possible ion-beam damage and eliminates the ion-neutralization problem. 14 Recently, we proved that TOF-MEIS could acquire quantitative compositional and structural data from nanometer-scale particles that cannot be achieved by energy-dispersive X-ray spectroscopy (EDS) or X-ray photoelectron spectroscopy (XPS) techniques with a depth resolution of more than 1–2 nm.…”
Section: Introductionmentioning
confidence: 99%
“… 13 Moreover, in contrast to transmission electron microscopy (TEM), which characterizes each nanocluster, TOF-MEIS obtains the representative average information from billions of nanoclusters on the relatively large detection area (500 × 750 μm 2 ). 13 15 …”
Section: Introductionmentioning
confidence: 99%
“…With the use of a tightly focused ion beam, it has the highest spatial resolution, beyond even the optical limitation of a laser focus 19 . SIMS has been used for element and isotope analyses 20 21 as a powerful tool to quantify and visualize known molecules on the scale of tens of nanometers 22 , while the identification of newly found molecules by MS/MS analysis is still a challenge for SIMS 23 . Precise isotope ratio measurements can reveal even chemical processes underlying mechanisms 24 .…”
mentioning
confidence: 99%