“…Smooth interphases and sharp interfaces are more or less difficult to reveal, characterize, and quantify, particularly at the nanometer scale. At this scale level, transmission electron microscopy (TEM) or scanning electron microscopy (SEM) are often used to observe and characterize multiphase materials. ,,,,− The correct characterization of the materials requires typically 1) the use of a suitable contrasting method or a contrasting aid, e.g., sputtering for SEM or staining for TEM, 2) imaging under proper conditions (temperature, pressure, electron flow), and 3) the establishment of robust methods or refined image treatments, − in other words, a good image analysis, leading to a representative quantification of the different phases.…”