2008
DOI: 10.1016/j.ndteint.2007.08.006
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Quantitative determination of a subsurface defect of reference specimen by lock-in infrared thermography

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Cited by 83 publications
(73 citation statements)
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“…where q is the rate of energy emission (W), A is the area of emitting surface (m heating, lock-in, vibrothermography and pulsed phase thermography [6][7][8][9][10][11][12][13][14].…”
Section: Theorymentioning
confidence: 99%
“…where q is the rate of energy emission (W), A is the area of emitting surface (m heating, lock-in, vibrothermography and pulsed phase thermography [6][7][8][9][10][11][12][13][14].…”
Section: Theorymentioning
confidence: 99%
“…Pulsed, lock-in and pulse-phase thermography techniques are among the most common active infrared thermography techniques [7][8][9][10]. These active infrared techniques use external heat sources such as halogen lamps to create thermal waves through the target structures, and identify defects by examining differences in heat transfer characteristics between defect and intact areas.…”
Section: Introductionmentioning
confidence: 99%
“…The effectiveness of IR thermography in detecting subsurface defect in metallic components has widely been validated in many studies [10][11][12]. However, defects usually present weak indications in thermograms.…”
Section: Introductionmentioning
confidence: 99%