Quantitative dopant profiling in semiconductors: A Kelvin probe force microscopy model

Baumgart, Christine; Helm, M.; Schmidt, Heidemarie

doi:10.1103/physrevb.80.085305

Cited by 47 publications

(44 citation statements)

References 31 publications

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“…It can be seen that the surface potential of the GeSi QRs exhibits a ring-shaped feature, showing that the QRs' rim has smaller CPD values than the QRs' central hole. In SKM, the measured CPD is defined as Φ tip − Φ sample [37-39], where Φ tip and Φ sample are work functions of the tip and the sample, respectively. The conductive tip used in SKM was W 2 C-coated Si tip.…”

Section: Resultsmentioning

confidence: 99%

Nanoscale electrical property studies of individual GeSi quantum rings by conductive scanning probe microscopy

Cui

Yang

2012

Nanoscale Res Lett

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The nanoscale electrical properties of individual self-assembled GeSi quantum rings (QRs) were studied by scanning probe microscopy-based techniques. The surface potential distributions of individual GeSi QRs are obtained by scanning Kelvin microscopy (SKM). Ring-shaped work function distributions are observed, presenting that the QRs' rim has a larger work function than the QRs' central hole. By combining the SKM results with those obtained by conductive atomic force microscopy and scanning capacitance microscopy, the correlations between the surface potential, conductance, and carrier density distributions are revealed, and a possible interpretation for the QRs' conductance distributions is suggested.

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Section: Resultsmentioning

confidence: 99%

Nanoscale electrical property studies of individual GeSi quantum rings by conductive scanning probe microscopy

Cui

Yang

2012

Nanoscale Res Lett

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“…Experimental determination of the positron affinity requires the knowledge of the electron work function. Such measurements are often based on the contact potential difference method (e.g., Kelvin probe) which has recently been doubted to be really related to this difference for semiconductors [36]. This might lead to the revision of some experimental results related to positron affinity determination.…”

Section: Methodsmentioning

confidence: 99%

Improved generalized gradient approximation for positron states in solids

Kuriplach

Barbiellini

2014

Phys. Rev. B

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Several first-principles calculations of positron-annihilation characteristics in solids have added gradient corrections to the local-density approximation within the theory by Arponen and Pajanne [Ann. Phys. (NY) 121, 343 (1979)] since this theory systematically overestimates the annihilation rates. As a further remedy, we propose to use gradient corrections for other local-density approximation schemes based on perturbed hypernetted chain and on quantum Monte Carlo results. Our calculations for various metals and semiconductors show that the proposed schemes generally improve the positron lifetimes when they are confronted with experiment. We also compare the resulting positron affinities in solids with data from slow-positron measurements.

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“…The theory of spatial resolution, effect of topographic inhomogeneities (topographic cross-talk), and image formation mechanism in KPFM for conductive and semiconductive materials are studied extensively. [ 89 ] The complementary approach for electrostatic force imaging is Electrostatic Force Microscopy (EFM), in which the electrostatic force gradient acting on the tip is determined from the resonant frequency shift of dc biased vibrating cantilever, 2 . Unlike KPFM, the absolute strength of signal in EFM is diffi cult to quantify and the method is more sensitive to surface topography through the tip-surface force gradient, C ′ ′ .…”

Section: Imaging Of Active Device Structuresmentioning

confidence: 99%

Local Electrochemical Functionality in Energy Storage Materials and Devices by Scanning Probe Microscopies: Status and Perspectives

Kalinin

Balke

2010

Advanced Materials

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Energy storage and conversion systems are an integral component of emerging green technologies, including mobile electronic devices, automotive, and storage components of solar and wind energy economics. Despite the rapidly expanding manufacturing capabilities and wealth of phenomenological information on the macroscopic device behaviors, the microscopic mechanisms underpinning battery and fuel cell operations in the nanometer-micrometer range are virtually unknown. This lack of information is due to the dearth of experimental techniques capable of addressing elementary mechanisms involved in battery operation, including electronic and ion transport, vacancy injection, and interfacial reactions, on the nanometer scale. In this article, a brief overview of scanning probe microscopy (SPM) methods addressing nanoscale electrochemical functionalities is provided and compared with macroscopic electrochemical methods. Future applications of emergent SPM methods, including near field optical, electromechanical, microwave, and thermal probes and combined SPM-(S)TEM (scanning transmission electron microscopy) methods in energy storage and conversion materials are discussed.

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Quantitative dopant profiling in semiconductors: A Kelvin probe force microscopy model

Cited by 47 publications

References 31 publications

Nanoscale electrical property studies of individual GeSi quantum rings by conductive scanning probe microscopy

Nanoscale electrical property studies of individual GeSi quantum rings by conductive scanning probe microscopy

Improved generalized gradient approximation for positron states in solids

Local Electrochemical Functionality in Energy Storage Materials and Devices by Scanning Probe Microscopies: Status and Perspectives

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