2019
DOI: 10.1002/polb.24875
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Quantitative Image Analysis of Fractal‐Like Thin Films of Organic Semiconductors

Abstract: Morphology modulation offers significant control over organic electronic device performance. However, morphology quantification has been rarely carried out via image analysis. In this work, we designed a MATLAB program to evaluate two key parameters describing morphology of small molecule semiconductor thin films: fractal dimension and film coverage. We then use this program in a case study of meniscus‐guided coating of 2,7‐dioctyl[1]benzothieno[3,2‐b][1]benzothiophene (C8‐BTBT) under various conditions to ana… Show more

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Cited by 12 publications
(9 citation statements)
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References 49 publications
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“…While the low surface energy of the PTS might have lowered the Gibbs' free energy for nucleation on PTS substrates compared to plasma treated SiO 2 ,13 the monolayer film was still riddled with voids, giving a film coverage of ≈86%. Quantitatively, we determined using an image analysis protocol we developed18 that the fractal dimension of the monolayer films on IL is 2, which significantly decreases to 1.33 ± 0.06 and 1.48 ± 0.05 for those on plasma SiO 2 and PTS, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…While the low surface energy of the PTS might have lowered the Gibbs' free energy for nucleation on PTS substrates compared to plasma treated SiO 2 ,13 the monolayer film was still riddled with voids, giving a film coverage of ≈86%. Quantitatively, we determined using an image analysis protocol we developed18 that the fractal dimension of the monolayer films on IL is 2, which significantly decreases to 1.33 ± 0.06 and 1.48 ± 0.05 for those on plasma SiO 2 and PTS, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…Image analysis was performed on the thin films of APIs using a MATLAB code to find the exact area exposed to water. 39 Film Thickness Measurement. The thickness of API films was measured using Asylum Cypher AFM with Tap300AI-G tapping mode AFM tips.…”
Section: ■ Experimental Methodsmentioning
confidence: 99%
“…The morphology of the solution coated thin films was visualized using a cross-polarized optical microscope (Nikon ECLIPSE Ci-POL) and imaging software (NIS-Elements). Image analysis was performed on the thin films of APIs using a MATLAB code to find the exact area exposed to water …”
Section: Experimental Methodsmentioning
confidence: 99%
“…Talu S. et al [32] 2016 Co/CP/X Electrochemistry SEM Feng F. et al [76] 2017 MgO EPSAD AFM Nasehnejad M. et al [81] 2017 silver electrodeposition sputtering AFM Soumya S. et al [43] 2017 ZnS PLD AFM Yadav R. P. et al [91] 2017 ZnO atom beam sputtering AFM Talu S. et al [73] 2017 Ag-Cu magnetron sputtering AFM Talu S. et al [142] 2017 carbon-nickel magnetron sputtering AFM Talu S. et al [165] 2017 contact lenses polished AFM Talu S. et al [143] 2017 filler nanoparticles spin-coating AFM Talu S. et al [144] 2017 Ni NPs@a-C CVD AFM Sani Z. K. et al [145] 2017 [155] 2019 C8-BTBT meniscus-guided coating OM Ghosh K. et al [86] 2019 ZnO sol-gel spin-coating AFM Mwema F. M. et al [156] 2019 Al magnetron sputtering AFM Pedro, G.d.C. et al [157] 2019 chlorophyll (Chl) casting & drying OM Talu S. et al [63] 2020 Ag-Cu magnetron sputtering AFM Jafari A. et al [158] 2020 copper oxide magnetron sputtering AFM Yildiz K. et al [159] 2020 montmorillonite cast OM Aminirastabi H. et al [160] 2020 BaTiO 3 sol-gel -Yang L. et al [161] 2021 Pt electroless plating SEM Jiang Y. et al [163] 2021 MoS 2 CVD OM Jiang H. et al [15] 2021 metallic glass ion beam deposition STEM Romaguera Y. et al [164] 2021 GdMnO 3 spin-coating AFM…”
Section: Abbreviations Appendix Amentioning
confidence: 99%