2012
DOI: 10.1021/la302706b
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Quantitative Mapping of the Elastic Modulus of Soft Materials with HarmoniX and PeakForce QNM AFM Modes

Abstract: The modulus of elasticity of soft materials on the nanoscale is of interest when studying thin films, nanocomposites, and biomaterials. Two novel modes of atomic force microscopy (AFM) have been introduced recently: HarmoniX and PeakForce QNM. Both modes produce distribution maps of the elastic modulus over the sample surface. Here we investigate the question of how quantitative these maps are when studying soft materials. Three different polymers with a macroscopic Young's modulus of 0.6-0.7 GPa (polyurethane… Show more

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Cited by 333 publications
(287 citation statements)
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“…To that purpose, the peak force is kept almost the same as the reference sample in the three areas [29].…”
Section: Mechanical Characterization By Harmonix Afmmentioning
confidence: 99%
See 1 more Smart Citation
“…To that purpose, the peak force is kept almost the same as the reference sample in the three areas [29].…”
Section: Mechanical Characterization By Harmonix Afmmentioning
confidence: 99%
“…In addition, these techniques are able to simultaneously provide topographic maps (from tens of nanometers up to microns) of the sample allowing a direct correlation among mechanical and morphological sample 2 International Journal of Polymer Science properties. Both AFM based methods, HarmoniX and Peak Force, are appropriate for the mechanical characterization of soft matter [29,30]. In particular, HarmoniX technique operates in tapping mode and makes use of specifically designed cantilever geometries with an out-of-axis tip [31,32].…”
Section: Introductionmentioning
confidence: 99%
“…Moreover, it can be difficult to extract subtle changes in mechanical properties when the measurement system is driven near resonance because of the large amount of energy stored in the system. More recently peak force 4 and digital pulse force 7 methods were introduced allowing for data collection with only one or few cycles over each pixel, and for off resonance operation making the detection schemes more sensitive to slight changes in sample properties. These newer methods all contain the snap-to-contact event in each cycle of data collection.…”
Section: Introductionmentioning
confidence: 99%
“…AFM images were obtained using a Bruker Multimode 8 scanning probe microscope with NanoScope V controller in the PeakForce Tapping™ mode. A Young's modulus map and histogram for the polymer blend were acquired using PeakForce Quantitative Nanomechanical Mapping™ and the Derjaguin-Muller-Toporov model following required calibration [5,6].…”
mentioning
confidence: 99%