“…Other QPM and surface measurement techniques.-Aside from the well-researched AFM, VSI, and DHM techniques, there are other varieties of QPM and surface measuring systems, as shown in Table IV that would be relevant for discussion, including in situ scanning tunneling microscopy (STM), 119,[121][122][123] confocal laser scanning microscopy (CLSM), 114,[116][117][118] digital holography (DH) 102,104,105 digital speckle pattern interferometry (DSPI), [100][101][102] in situ special modulation interferometry (SMI) 124 and in situ light reflectivity microscopy, 125,126 etc. Interestingly, their working principles or mode of operation are quite similar to the three systems (AFM, VSI, and DHM) earlier discussed above.…”