Quantitative measurement of deformation field around low-angle grain boundaries by electron microscopy

Zhao, Chunwang; Xing, Yongming; Bai, Peng; Hou, Jinfeng; Dai, Xianglu

doi:10.1016/j.physb.2007.10.157

Cited by 29 publications

(11 citation statements)

References 15 publications

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“…, for measuring strain near a dislocation , for observing singularities like disclinations in nanoparticles , for measuring residual stresses and for measuring deformation near a crack tip. Strain fields were also measured in many other situations, for instance, around low‐angle grain boundaries , in silicon transistors , in nanowires or in MEMS devices . The geometric phase analysis (GPA) briefly described in Section 4.4 was employed in these last examples.…”

Section: Examplesmentioning

confidence: 99%

The Grid Method for In‐plane Displacement and Strain Measurement: A Review and Analysis

Grédiac

Sur

Blaysat

2016

Strain

141

162

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The grid method is a technique suitable for the measurement of in-plane displacement and strain components on specimens undergoing a small deformation. It relies on a regular marking of the surfaces under investigation. Various techniques are proposed in the literature to retrieve these sought quantities from images of regular markings, but recent advances show that techniques developed initially to process fringe patterns lead to the best results. The grid method features a good compromise between measurement resolution and spatial resolution, thus making it an efficient tool to characterise strain gradients. Another advantage of this technique is the ability to establish closed-form expressions between its main metrological characteristics, thus enabling to predict them within certain limits. In this context, the objective of this paper is to give the state of the art in the grid method, the information being currently spread out in the literature. We propose first to recall various techniques that were used in the past to process grid images, to focus progressively on the one that is the most used in recent examples: the windowed Fourier transform. From a practical point of view, surfaces under investigation must be marked with grids, so the techniques available to mark specimens with grids are presented. Then we gather the information available in the recent literature to synthesise the connection between three important characteristics of full-field measurement techniques: the spatial resolution, the measurement resolution and the measurement bias. Some practical information is then offered to help the readers who discover this technique to start using it. In particular, programmes used here to process the grid images are offered to the readers on a dedicated website. We finally present some recent examples available in the literature to highlight the effectiveness of the grid method for in-plane displacement and strain measurement in real situations.

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Section: Examplesmentioning

confidence: 99%

The Grid Method for In‐plane Displacement and Strain Measurement: A Review and Analysis

Grédiac

Sur

Blaysat

2016

Strain

141

162

View full text Add to dashboard Cite

show abstract

“…Recently, highresolution transmission electron microscopy (HRTEM) has become a powerful tool for mapping the displacements and the strain fields at the nano-scale level because of the development of quantitative image analysis methods [1,2], and especially, the geometric phase analysis (GPA) technique, whose accuracy has demonstrated that it could be measured to 0.003 nm, is one of such techniques [3,4]. So far, the GPA has successfully been applied to a wide variety of systems, such as quantum dots [5], nanowires [6], Si/Ge heterostructures [7] and low-angle grain boundaries [8]. Furthermore, the GPA technology has also been applied to quantitative measurements of the displacement field of the edge dislocation in metal aluminum and gold [1,9].…”

Section: Introductionmentioning

confidence: 99%

Experimental examination of strain field within GP zone in an Al–Zn–Mg–Cu alloy

Bai

Liu

Hou

et al. 2012

Physica B: Condensed Matter

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“…This value is purely geometric. However, it has been shown the existence of chemically altered zone around the GB, in relation with short-and long-range elastic strain fields and solid segregation gradients [39,40]. This strained/distorted region around the structural grain boundary corresponds to the zone of enhanced diffusion rate or the ''segregational'' zone.…”

Section: Simulation Proceduresmentioning

confidence: 99%

Effects of grain-boundary networks on the macroscopic diffusivity of hydrogen in polycrystalline materials

Hoch

Metsue

Bouhattate

et al. 2015

Computational Materials Science

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Quantitative measurement of deformation field around low-angle grain boundaries by electron microscopy

Cited by 29 publications

References 15 publications

The Grid Method for In‐plane Displacement and Strain Measurement: A Review and Analysis

The Grid Method for In‐plane Displacement and Strain Measurement: A Review and Analysis

Experimental examination of strain field within GP zone in an Al–Zn–Mg–Cu alloy

Effects of grain-boundary networks on the macroscopic diffusivity of hydrogen in polycrystalline materials

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