“…The list of analyzed granite samples and extracted zircons, indicating the methods used and the corresponding number of measurements: OM-optical microscopy of granites in thin sections and extracted zircon grains, SEM-scanning electron microscopy (JSM-6460LV, Saint Petersburg, Russia) includes BSE imaging, WDX analysis of zircon and neighboring minerals in thin sections; SEM *-scanning electron microscopy (JEOL JSM-7001F, Freiberg, Germany) includes SE imaging of extracted zircon grains, applied to electrically conductive tape, to study the surface of crystal faces and BSE imaging of zircon grains, impregnated into epoxy resin and polished, to study the inner structure; SIMS-secondary ion mass spectrometry (Cameca IMS-4f, Yaroslavl, Russia) of zircon grains, impregnated into epoxy resin, to measure the trace element content (accompanied with BSE and cathodoluminescence (CL) imaging of zircon inner structure); Raman spectroscopy was applied to measure the degree of zircon crystallinity (Renishaw InVia Raman spectrometer, Saint Petersburg, Russia); XRF analysis of granite samples to determine the content of petrogenic elements and ICP-MS analysis for the petrogenic elements, as well as for a wide range of trace elements (Actlabs, Ancaster, ON, Canada). The analysis of the trace elements content in zircon (67 analytical points/41 grains) was carried out on the Cameca IMS-4f ion microprobe (Valiev Institute of Physics and Technology of RAS, Yaroslavl, Russia) using standard methods [21,22]. The ion beam diameter was not more than 15-20 µm, the relative error for the majority of elements did not exceed 15%, and the detection limit is 10 ppb on average.…”