Quantitative Microstructure Analysis to Predict Electrical Property of NiO-YSZ Anode Support for SOFCs

Abstract

>> The correlation between NiO-YSZ microstructure and its electrical property used for SOFC anode was critically evaluated with image processing and direct measurement techniques. These innovative processing techniques were employed to quantify the contiguity of the anode constituent phase. The calculated contiguities were then correlated with electrical conductivity attained from 4-probe DC method. This investigation described that contiguity of nickel oxide phases of an anode has a linear relationship with its electrical conductivity. We observed that the contiguity of NiO increased from 0.18 to 0.50 then electrical conductivity attained was significantly increased from 520 S/cm to 1468 S/cm at 900°C.