Quantitative Normal Force Measurements by Means of Atomic Force Microscopy Towards the Accurate and Easy Spring Constant Determination

Abstract

Due to its rapid popularity increase within last three decades, with particular focus on submicrometer quantitative surface's properties imaging, atomic force microscopy (AFM) is still a subject of development and research in terms of both better understanding and efficient utilization of various measurement techniques. Quantitative and comparable measurements at nanoscale are a significant issue, as both: science and industry desire reliable results, allowing to perform repetitive experiments at any time and location. Therefore a numerous analysis and research projects were carried out to provide metrological approach for those techniques in terms of providing the traceability and the uncertainty estimation. In this paper an overview of various methods and approaches towards quantitative determination of the normal spring constant of the AFM probes is presented.

Use of Atomic Force Microscopy to Measure Mechanical Properties and Turgor Pressure of Plant Cells and Plant Tissues

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Investigation of various properties of HfO 2 -TiO 2 thin film composites deposited by multi-magnetron sputtering system

“…Analysis of the surface properties of deposited coatings was performed using Bruker by atomic force microscope (AFM) working in a contact mode [32,33]. For the analysis of the AFM images a WSxM ver.5.0 software was used [34].…”

Fish Otolith Matrix Macromolecule-64 (OMM-64) and Its Role in Calcium Carbonate Biomineralization

“…Measurements were carried out using NT-MDT measuring probes made of N-type silicon monocrystalline with antimony doping. The elastic constant was determined using the thermal method. , Mechanical inhomogeneities of the surface of CaCO 3 crystals were recorded in the FMM mode. Surface rigidity maps were used to identify surface areas of potentially different mechanical properties.…”