Quantitative Stress Measurements of Bulk Microdefects in Multicrystalline Silicon

Buonassisi, Tonio; Bagdahn, J.; Koepge, R.; Ganapati, Vidya; Sampson, Aaron L.; Schoenfelder, Stephan

doi:10.4229/24theupvsec2009-2ao.3.5

24th European Photovoltaic Solar Energy Conference 2009

DOI: 10.4229/24theupvsec2009-2ao.3.5

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Quantitative Stress Measurements of Bulk Microdefects in Multicrystalline Silicon

Tonio Buonassisi

J. Bagdahn²,

R. Koepge³

et al.

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2010

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Stresses and their relation to defects in multicrystalline solar silicon

Sarau

Bochmann

Christiansen

et al. 2010

2010 35th IEEE Photovoltaic Specialists Conference

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We report research on the characterization of stresses in relation to defects in multicrystalline silicon (mc-Si) solar cell material. Photoelasticity and micro-Raman spectroscopy (µRS) techniques are combined to understand this correlation at different length scales. While photoelasticity can probe small residual thermal stresses distributed over the entire volume of the sample as well as local stresses caused by defects, RS can measure very localized intrinsic stresses of defects existing at the sample surface. Defects such as dislocations and inclusions are usually accompanied by stresses. In combination with thermal stresses, it results in a global residual stress state in the material. Thermal stresses are induced by the mismatch of different coefficients of thermal expansion between inclusions and silicon as well as due to local inhomogeneous temperature gradients during crystallization. Thermal stresses that relax by forming efficiency limiting defects can be redu ced below the yield stress values by optimizing the crystallization conditions using photoelasticity

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Stresses and their relation to defects in multicrystalline solar silicon

Sarau

Bochmann

Christiansen

et al. 2010

2010 35th IEEE Photovoltaic Specialists Conference

View full text Add to dashboard Cite

show abstract

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Quantitative Stress Measurements of Bulk Microdefects in Multicrystalline Silicon

Cited by 1 publication

References 7 publications

Stresses and their relation to defects in multicrystalline solar silicon

Stresses and their relation to defects in multicrystalline solar silicon

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