Quantitative ToF SIMS Analysis of Spun-Cast and Solution-Cast Polymer Films

Leeson, Alistair M.; Alexander, Morgan R.; Short, Robert D.; Hearn, M. J.; Briggs, D.

doi:10.1080/10236669708033942

Cited by 7 publications

(4 citation statements)

References 28 publications

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“…Leeson et al . studied PMMA that was spin and solution coated on aluminum substrates. They used PMMA standards with various molecular weights and studied the effects of molecular weight and film thickness on SIMS spectra.…”

Section: Introductionmentioning

confidence: 99%

Lateral and Vertical Quantification of Spin-Coated Polymer Films on Silicon by TOF-SIMS, XPS, and AFM

2002

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PMMA and PVC were spin coated on silicon wafers using a range of polymer concentrations. This resulted in a corresponding range of film thicknesses and, for ultrathin film layers, various degrees of surface coverage. The thickness was determined by AFM profilometry and was used to correlate the time scale of a dynamic TOF-SIMS depth profile analysis to a depth scale. The degree of surface coverage was determined from AFM imaging and was used to correlate polymer secondary-ion yields of a static TOF-SIMS analysis to the degree of surface coverage. TOF-SIMS imaging was found to be inferior to AFM imaging with regard to determining the degree of surface coverage of polymers on silicon surfaces. PVC and PMMA both form separated domains on silicon when using spin-coating solutions with a polymer concentration below a materialdependent threshold. In the intermediate concentration range between domain formation and complete surface coverage, networks form. At low concentrations, the deposited polymer material was heterogeneously distributed in the plane of the film as well as vertically to the substrate, resulting in relatively thick hillocks distributed over a limited surface area. At higher concentrations, where network formation is observed, the polymer is heterogeneously distributed in the plane of the film with a large degree of surface coverage, and the average small thickness of the polymer network is fairly constant. A linear correlation was observed between the secondary-ion yield and the degree of surface coverage for both PVC and PMMA, which constitutes the calibration curves for the lateral quantification.

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Section: Introductionmentioning

confidence: 99%

Lateral and Vertical Quantification of Spin-Coated Polymer Films on Silicon by TOF-SIMS, XPS, and AFM

2002

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“…TOF‐SIMS is a technique based on mass spectrometry and is therefore said not to be a quantitative technique. However, in spite of TOF‐SIMS not being a quantitative technique in principle, many workers have made extensive efforts to find ways to use TOF‐SIMS quantitatively 12–62. Whether or not TOF‐SIMS can be said to be quantitative is still debated.…”

Section: Introductionmentioning

confidence: 99%

Quantification of grafted poly(ethylene glycol)‐silanes on silicon by time‐of‐flight secondary ion mass spectrometry

et al. 2002

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Silicon grafted monodisperse poly(ethylene glycol) (PEG) silanes with various PEG chain lengths and mixtures of these were systematically analyzed with static time-of-flight secondary ion mass spectrometry (TOF-SIMS). The mass spectra show differences in the various relative signal intensities, an observation that was used to elucidate important aspects of the grafting process. The relationship between PEG-silane fragment ion abundances and Si(+) ion abundances were used to (i) qualitatively describe layer thicknesses of grafted mixtures of PEG-silanes on silicon, (ii) construct a calibration curve from which PEG chain length (or molecular mass) can be determined and (iii) quantitatively determine surface mixture compositions of grafted monodisperse PEG-silanes of different chain lengths (3, 7 and 11 PEG units). The results suggest that discrimination does take place in the adsorption process. The PEG-silane with the shorter PEG chain is discriminated for mixtures containing PEG3-silane, whereas the PEG-silane with the longer PEG chain is discriminated in PEG7/PEG11-silane mixtures. The origin of this difference in adsorption behavior is not well understood. Aspects of the grafting process and the TOF-SIMS analyses are discussed.

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“…ToF‐SIMS, due to its high surface sensitivity, generates potentially rich information on surfaces that can be very useful for elucidating molecular interactions at scale. From simple polymers to complex biological samples, ToF‐SIMS can discern the chemical nature and molecular structure with nanometre precision in depth and tens of nanometre precision spatial resolution, enabling a comprehensive investigation of the surface chemistry of a particular sample . A major problem with ToF‐SIMS is the multidimensional nature of the output data, coming from various sources on the surface and the fragmentation events which occur.…”

Section: Introductionmentioning

confidence: 99%

Multivariate analysis of ToF‐SIMS data using mass segmented peak lists

Madiona

Welch

Russell

et al. 2018

Surface & Interface Analysis

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Time-of-flight secondary ion mass spectrometry (ToF-SIMS) provides detailed molecular insight into the surface chemistry of a diverse range of material types. Extracting useful and specific information from the mass spectra and reducing the dimensionality of very large datasets are a challenge that has not been fully resolved. Multivariate analysis has been widely deployed to assist in the interpretation of ToF-SIMS data.Principal component analysis is a popular approach that requires the generation of peak lists for every spectrum. Peak list sizes and the resulting data matrices are growing, complicating manual peak selection and analysis. Here we report the generation of very large ToF-SIMS peak lists using up-binning, the mass segmentation of spectral data in the range 0 to 300 m/z in 0.01 m/z intervals. Time-of-flight secondary ion mass spectrometry data acquired from a set of 4 standard polymers (polyethylene terephthalate, polytetrafluoroethylene, poly(methyl methacrylate), and low-density polyethylene) are used to demonstrate the efficacy of this approach. The polymer types are discriminated to a moderate extent by principal component analysis but are easily skewed with saturated species or contaminants present in ToF-SIMS data.Artificial neural networks, in the form of self-organising maps, are introduced and provide a non-linear approach to classifying data and focussing on similarities between samples. The classification outcome achieved is excellent for different polymer types and for spectra from a single polymer type generated by using different primary ions.This method offers great promise for the investigation of more complex systems including polymer classes and blends and mixtures of biological materials.

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Quantitative ToF SIMS Analysis of Spun-Cast and Solution-Cast Polymer Films

Cited by 7 publications

References 28 publications

Lateral and Vertical Quantification of Spin-Coated Polymer Films on Silicon by TOF-SIMS, XPS, and AFM

Lateral and Vertical Quantification of Spin-Coated Polymer Films on Silicon by TOF-SIMS, XPS, and AFM

Quantification of grafted poly(ethylene glycol)‐silanes on silicon by time‐of‐flight secondary ion mass spectrometry

Multivariate analysis of ToF‐SIMS data using mass segmented peak lists

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