2014
DOI: 10.1016/j.solmat.2013.10.028
|View full text |Cite
|
Sign up to set email alerts
|

Quantum confinement in mixed phase silicon thin films grown by co-deposition plasma processing

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

0
5
0

Year Published

2015
2015
2022
2022

Publication Types

Select...
6
1

Relationship

0
7

Authors

Journals

citations
Cited by 9 publications
(5 citation statements)
references
References 32 publications
0
5
0
Order By: Relevance
“…The authors investigated the electronic properties of these films as a function of the nanocrystalline silicon fraction and found that the dark conductivities of the films with 2–4% nanocrystals were enhanced by several orders of magnitude compared to films with much lower or much higher nanocrystal fractions. Fields et al studied films produced with the same hybrid synthesis approach. The authors showed that the photoluminescence peak intensity shifted to energies as high as 1.35 eV, higher than that expected from bulk silicon, and argued that this is due to quantum confinement in silicon nanocrystals embedded in a-Si:H film.…”
Section: Applicationsmentioning
confidence: 99%
“…The authors investigated the electronic properties of these films as a function of the nanocrystalline silicon fraction and found that the dark conductivities of the films with 2–4% nanocrystals were enhanced by several orders of magnitude compared to films with much lower or much higher nanocrystal fractions. Fields et al studied films produced with the same hybrid synthesis approach. The authors showed that the photoluminescence peak intensity shifted to energies as high as 1.35 eV, higher than that expected from bulk silicon, and argued that this is due to quantum confinement in silicon nanocrystals embedded in a-Si:H film.…”
Section: Applicationsmentioning
confidence: 99%
“…The origin of the broad PL spectrum of nc-Si:H is attributed to the size distribution and local fluctuations in matrix hydrogenation. In addition, the temperature dependence of this PL suggests that these nc-Si:H have fewer defects than those grown by conventional PECVD [60]. Based on the above results obtained from the previous studies, there is no clear cut evidence to explain the origin of PL.…”
Section: Resultsmentioning
confidence: 78%
“…The bands attributed to a-Si:H and nc-Si regions [59]. Very recently, the same authors have observed two PL peaks at 1.15 and 1.35 eV with co-deposited a/nc-Si:H by PECVD technique [60]. The origin of the broad PL spectrum of nc-Si:H is attributed to the size distribution and local fluctuations in matrix hydrogenation.…”
Section: Resultsmentioning
confidence: 91%
“…Beyond the basic science, this could have important tech nological applications for nanocrystalline multifunctional materials [14,15] and ultra thin silicon membranes [16] in which phonons are managed to better assist charge transport, control heat conduction, tune thermoelectric behavior [17], and modify localized phonon populations in order to slow the cooling of excited electrons and holes. This analysis is also relevant for coreshell silicon nanocrystals in which a super ficial layers can spontaneously amorphize due to superficial layers so inducing a confinement of such modes within the core.…”
Section: Introductionmentioning
confidence: 99%