2014
DOI: 10.1007/s10825-014-0595-7
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Quantum drift-diffusion model for IMPATT devices

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Cited by 19 publications
(8 citation statements)
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“…The noise measure of the diodes sharply decreases with the increase of operating frequency. The multiplication region width of the diodes decreases with the increase of operating frequency . Thus the narrower multiplication region or avalanche region widths cause less amount of random impact ionization in higher frequency diodes.…”
Section: Characteristics Of G‐impatt Sourcesmentioning
confidence: 99%
“…The noise measure of the diodes sharply decreases with the increase of operating frequency. The multiplication region width of the diodes decreases with the increase of operating frequency . Thus the narrower multiplication region or avalanche region widths cause less amount of random impact ionization in higher frequency diodes.…”
Section: Characteristics Of G‐impatt Sourcesmentioning
confidence: 99%
“…[ 24–28 ] The parameters describing the structure and the doping concentrations of HM and HT DDR IMPATTs as mentioned before are distinctly considered for design at 500 GHz for Al m Ga 1‐m N∼GaN, which are tabulated in Table A meticulous scrutiny is carried out to study the thermal performance of heat sink [ 29 ] required to limit the temperature increase at the junction to avoid thermal runaway. An iterative method [ 30 ] is used for the dc simulation of the HT and HM devices considered here. The method is laid on two factors: location of the maximum electric field and its value at that point.…”
Section: Discussionmentioning
confidence: 99%
“…End results of all the HM and HT structures considered here are designed using a drift‐diffusion model and double‐iterative field maximum simulation method. [ 30 ] Primary device equations are solved considering the constraints at the boundary of the depletion layer [ 22 ] and substituting modulation factor to be zero to obtain the static properties of the device.…”
Section: Simulated Outputs For Ht Al04ga06n∼gan and Its Hm Counterpartsmentioning
confidence: 99%
“…Various DC parameters of the diode, which governs the microwave properties of the diode, can be obtained by analyzing the electric field and carrier current profile. The basic process involved is to determine the solutions of Poisson's equation and current continuity equation . Analytical solution of these equations under realistic conditions is an extremely difficult task.…”
Section: Modeling and Computational Proceduresmentioning
confidence: 99%