1994
DOI: 10.1063/1.111164
|View full text |Cite
|
Sign up to set email alerts
|

Quantum well lasers with carbon doped cladding layers grown by solid source molecular beam epitaxy

Abstract: Data are presented which demonstrate that very high quality carbon (C) doped epilayers for the fabrication of AlGaAs-GaAs and AlGaAs-GaAs-InGaAs quantum well (QW) lasers can be grown by solid source molecular beam epitaxy (MBE) using a resistively heated graphite filament as a p-type dopant source. Broad area lasers fabricated from this material exhibit very low threshold current densities (66 A/cm2 for a 2-mm-long single QW AlGaAs-GaAs-InGaAs laser emitting at 980-nm wavelength). It is also shown that lasers … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

1
7
0

Year Published

1995
1995
2015
2015

Publication Types

Select...
5
2

Relationship

1
6

Authors

Journals

citations
Cited by 9 publications
(8 citation statements)
references
References 20 publications
1
7
0
Order By: Relevance
“…10 Our results are comparable to the best values obtained for comparable device structures ͑without any growth interruptions͒ of which we are aware: 45 A/cm 2 for beryllium-doped lasers, 11 66 A/cm 2 for carbon-doped lasers. 5 Our carbon-and beryllium-doped lasers with cladding layers grown at low substrate temperatures exhibited threshold current densities which were nearly as low. We obtained a threshold current density of 91 A/cm 2 for carbon-doped devices grown at 570°C.…”
Section: Resultsmentioning
confidence: 97%
See 1 more Smart Citation
“…10 Our results are comparable to the best values obtained for comparable device structures ͑without any growth interruptions͒ of which we are aware: 45 A/cm 2 for beryllium-doped lasers, 11 66 A/cm 2 for carbon-doped lasers. 5 Our carbon-and beryllium-doped lasers with cladding layers grown at low substrate temperatures exhibited threshold current densities which were nearly as low. We obtained a threshold current density of 91 A/cm 2 for carbon-doped devices grown at 570°C.…”
Section: Resultsmentioning
confidence: 97%
“…Although carbon doped ϳ980 nm lasers have been grown previously by metal-organic chemical vapor deposition ͑MOCVD͒ using carbon tetrachloride 4 or by solid-source MBE using a heated graphite filament, [5][6][7] there is only one recent report of which we are aware of such lasers grown by MBE using CBr 4 . 8 Carbon doping eliminates concerns over dopant diffusion which accompany the use of Be particularly at elevated substrate temperatures or high doping levels.…”
Section: Introductionmentioning
confidence: 99%
“…The n-type dopants for GaAs semiconductor are Sn [94,95], Se [96], S [97] and for InP the n-type dopants are Sn [98,99]. The p-type dopants for GaAs are Ge [100] and C [101] and for InP the p-type dopants are Be [102], and Zn [103]. Tellurium (Te) [104] have been used as an n-type impurity in InAs semiconductor.…”
Section: Doping Issues In Iii-v Semiconductorsmentioning
confidence: 99%
“…lasers with C-doped cladding was realized by solidsource molecular beam epitaxy [11]. High-power C-doped laser diodes (l=980 nm) using carbon tetrachloride (CCl 4 ) as precursor by MOCVD has been reported [12].…”
Section: Introductionmentioning
confidence: 99%