Quartz tuning fork-based conductive atomic force microscope with glue-free solid metallic tips

Botaya, Luis; Otero, J. F. Fuentes; González, Laura López; Coromina, Xavier; Gomila, Gabriel; Puig-Vidal, M.

doi:10.1016/j.sna.2015.06.006

Cited by 4 publications

(3 citation statements)

References 31 publications

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“…Some tip welding solutions attempt to minimize the additional mass, 22 and glue-free clamping solutions have been proposed to prevent these issues. 29,30 FIG. 2.…”

Section: B Probe Fabricationmentioning

confidence: 99%

Contributed Review: Quartz force sensing probes for micro-applications

Abrahamians

Van

Régnier

2016

Review of Scientific Instruments

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As self-sensing and self-exciting probes, quartz sensors present many advantages over silicon cantilevers for microscopy, micro-robotics, and other micro-applications. Their development and use is further bolstered by the fact that they can be manufactured from common quartz components. This paper therefore reviews applications of the increasingly popular quartz tuning fork probes as force sensors in the literature and examines the options for higher-frequency quartz probes using the other available types of flexional, thickness-shear or length-extensional resonators.

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“…Some tip welding solutions attempt to minimize the additional mass, 22 and glue-free clamping solutions have been proposed to prevent these issues. 29,30 FIG. 2.…”

Section: B Probe Fabricationmentioning

confidence: 99%

Contributed Review: Quartz force sensing probes for micro-applications

Abrahamians

Van

Régnier

2016

Review of Scientific Instruments

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“…On the other hand, electrical excitation of the device was desirable because it simplifies the design, and it allows for the quantification of the measurements (when the QTF is driven mechanically by using a dither piezo, the mechanical coupling between the dither and the QTF should be known for quantification). Following the idea presented in [ 23 ] for using a glue-free solution for developing the distance sensor based on optical fibers, authors presented a glue-free solution for metallic tips in a previous work [ 24 ]. Briefly, the metallic tip was placed in mechanical contact with the QTF resonator by using a specifically designed holder with a 3D micropositioning system.…”

Section: Multiprobe Experimental Setupmentioning

confidence: 99%

Visualized Multiprobe Electrical Impedance Measurements with STM Tips Using Shear Force Feedback Control

Botaya

Coromina

Samitier

et al. 2016

Sensors

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Here we devise a multiprobe electrical measurement system based on quartz tuning forks (QTFs) and metallic tips capable of having full 3D control over the position of the probes. The system is based on the use of bent tungsten tips that are placed in mechanical contact (glue-free solution) with a QTF sensor. Shear forces acting in the probe are measured to control the tip-sample distance in the Z direction. Moreover, the tilting of the tip allows the visualization of the experiment under the optical microscope, allowing the coordination of the probes in X and Y directions. Meanwhile, the metallic tips are connected to a current–voltage amplifier circuit to measure the currents and thus the impedance of the studied samples. We discuss here the different aspects that must be addressed when conducting these multiprobe experiments, such as the amplitude of oscillation, shear force distance control, and wire tilting. Different results obtained in the measurement of calibration samples and microparticles are presented. They demonstrate the feasibility of the system to measure the impedance of the samples with a full 3D control on the position of the nanotips.

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“…Quartz tuning fork has been used as the sensing component of atomic force microscopes (AFM) for various reasons. They are small in size, having low damping effect, and very versatile [1] [2] [3] [4]. Many variations of this design exist including combining the tuning fork with a diamond with NV center to probe the magnetic field in the vicinity of the sample surface [5].…”

Section: Introductionmentioning

confidence: 99%

Compensation of Parasitic Capacitance of Quartz Tuning Fork in AFM

Liu¹

2023

JAMP

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We have built an atomic force microscope using a quartz tuning fork as sensor. The excitation method we adopted, the electrical excitation, introduces stray capacitance into the signal-processing circuit. In this report, we demonstrated a simple but effective method to compensate for this parasitic capacitance by adding a compensator circuit consisting of an inverting amplifier and a capacitor. The capacitor is connected in series with the inverting amplifier and the compensator is connected in parallel with the quartz tuning fork. The resonance curve of the system measured after adding the homemade compensator resembles that of a pure RLC circuit, meaning that the stray capacitance is successfully eliminated. Furthermore, we tried to use our equipment to measure PDMS sample and got clean data. This system can be further combined with confocal microscope and diamond with NV defect to build scanning NV magnetometry.

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Quartz tuning fork-based conductive atomic force microscope with glue-free solid metallic tips

Cited by 4 publications

References 31 publications

Contributed Review: Quartz force sensing probes for micro-applications

Contributed Review: Quartz force sensing probes for micro-applications

Visualized Multiprobe Electrical Impedance Measurements with STM Tips Using Shear Force Feedback Control

Compensation of Parasitic Capacitance of Quartz Tuning Fork in AFM

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