Quasioptical millimeter-wave measurements: Refractive index of thin plates

Koppelmann, G.; Rudolph, H.

doi:10.1007/bf00903223

Cited by 5 publications

(2 citation statements)

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“…The last is implied by uncontrollable influence of the following factors on electric properties of the contact: surface layers of various origins, including oxidation; and a mechanical effect of the electrode on the sample's surface. On the contrary, radiowave methods of measuring materials' electrophysical parameters are devoid of mentioned shortcomings [1]. At the same time, these methods don't provide a sufficient locality of measurements by virtue of the principal restrictions on formation of a required configuration of wave field.…”

Section: Description Of the Method-investigated Samplesmentioning

confidence: 99%

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A method to study uniformity of electrophysical properties of high-resistance CdZnTe crystals

Komar

Chugai

Abashin

et al. 2005

IEEE Trans. Nucl. Sci.

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Uniformity of properties of a semiconductor material is one of the important conditions to achieve high spectrometric performance of ionizing radiation detectors. To study uniformity of electrophysical properties of crystals, an original method for acquisition of distributions of local values of a dielectric permittivity and tangent of a dielectric loss angle tan in high-resistance semiconductors is offered. The method was approved on Cd 1 Zn Te ( = 0 1 to 0.16) crystals grown by Bridgman method under high pressure of inert gas. Locality and reproducibility of measurements are provided by a special design of a movable electrode, with both the area and the hold-down pressure of the electric contact being unvaried. Differences in and tan distributions over the sample's area and an effect of uniform monochromatic illumination at a varied wavelength on these distributions are revealed. The physical nature of revealed irregularities is analyzed with involving results of researching CdZnTe crystals by diverse methods.

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Section: Description Of the Method-investigated Samplesmentioning

confidence: 99%

“…The simplest way to deduce the real part of a permittivity and tangent of a dielectric loss angle of a material, from measured and , can be realized if the sample in the said form is placed between two planar electrodes (1) (2)…”

Section: Description Of the Method-investigated Samplesmentioning

confidence: 99%