Quick scan chain diagnosis using signal profiling

Yang, Jheng-Syun; Huang, Shi-Yu

doi:10.1109/iccd.2005.89

Cited by 23 publications

(2 citation statements)

References 9 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The highest score indicates the most possible fault position. Most recent works on software-based scan chain diagnosis belong to simulation-based solutions [2,[7][8][9][10][11]. Scan cell fault candidates can be identified even by using conventional ATPG patterns.…”

Section: Introductionmentioning

confidence: 99%

A SAT-Based Pattern Generation Method for Diagnosis Multiple Scan Chain Faults

Wang

Yang

2011

AMR

View full text Add to dashboard Cite

Scan chain design is a widely used design-for-testability (DFT) technique to improve test and diagnosis quality. However, failures on scan chain itself account for up to 30% of chip failures. To diagnose root causes of scan chain failures in a short period is vital to failure analysis process and yield improvements. As the conventional diagnosis process usually runs on the faulty free scan chain, scan chain faults may disable the diagnostic process, leaving large failure area to time-consuming failure analysis. In this paper, a SAT-based technique is proposed to generate patterns to diagnose scan chain faults. The proposed work can efficiently generate high quality diagnostic patterns to achieve high diagnosis resolution. Moreover, the computation overhead of proving equivalent faults is reduced. Experimental results on ISCAS’89 benchmark circuits show that the proposed method can reduce the number of diagnostic patterns while achieving high diagnosis resolution.

show abstract

Section: Introductionmentioning

confidence: 99%

A SAT-Based Pattern Generation Method for Diagnosis Multiple Scan Chain Faults

Wang

Yang

2011

AMR

View full text Add to dashboard Cite

show abstract

“…Recent large industrial design [1] reported that nearly 44% of transistors in the logic part of the design reside within scan cells. In addition, it is reported that almost 50% defects can cause scan chain failure [2]. Therefore, defects are prone to impact both scan chains and system logic.…”

Section: Introductionmentioning

confidence: 99%

MOP-DDPG: Multiple Observation Points Oriented Deterministic Diagnostic Pattern Generation for Compound Faults

Wang

et al. 2010

ECS Trans.

View full text Add to dashboard Cite

Scan-based design is a widely used Design-for-Testability (DFT) technique to improve test and diagnosis quality. As scan chains and relative control logic can take up as much as 40% of transistors in logic part, defects are prone to impact both scan chains and system logic simultaneously. When these defects manifested as scan chain faults and system logic faults, we call such faults as compound faults. In this paper, we present a Multiple Observation Points Oriented Deterministic Diagnostic Pattern Generation (MOP-DDPG) technique that targets compound faults. We further propose a fault suspect analysis technique to find root cause of the faults either on scan chains or on system logic or both. Experimental results show that on average scale, MOP-DDPG can accurately locate a dozen of compound faults.

show abstract

Observation Point Oriented Deterministic Diagnosis Pattern Generation (DDPG) for Chain Diagnosis

Wang¹,

Hu²,

Huang

et al. 2008

2008 17th Asian Test Symposium

View full text Add to dashboard Cite

Scan is a widely usedDesign-for-Testability technique to improve test and diagnosis quality. Many defects may cause scan chains to fail. In this paper, an observation point oriented Deterministic Diagnostic Pattern Generation (DDPG) method was proposed for compound defects, which tolerates the system defects during scan chain diagnosis. Instead of sensitizing multiple paths proposed in our prior work, the proposed new DDPG method directly targets as many observation points as possible to observe the loading error occurred on the targeted scan cell. Experimental results on ISCAS'89 benchmark circuits show that the proposed DDPG method improves the effectiveness and efficiency of diagnosing compound defects, compared to our prior research.

show abstract

Quick scan chain diagnosis using signal profiling

Cited by 23 publications

References 9 publications

A SAT-Based Pattern Generation Method for Diagnosis Multiple Scan Chain Faults

A SAT-Based Pattern Generation Method for Diagnosis Multiple Scan Chain Faults

MOP-DDPG: Multiple Observation Points Oriented Deterministic Diagnostic Pattern Generation for Compound Faults

Observation Point Oriented Deterministic Diagnosis Pattern Generation (DDPG) for Chain Diagnosis

Contact Info

Product

Resources

About