1996
DOI: 10.1021/jp9610574
|View full text |Cite
|
Sign up to set email alerts
|

Quick-Scanning EXAFS in the Reflection Mode as a Probe for Structural Information of Electrode Surfaces with Time Resolution:  An in Situ Study of Anodic Silver Oxide Formation

Abstract: Time-dependent extended X-ray absorption fine structure (QEXAFS) measurements using the total external reflection geometry were used for the in situ investigation of the potentiostatic silver oxide formation in 1 M NaOH. It is demonstrated that this EXAFS tool yielding near range order structural information is well suited for time-resolved studies of electrode surfaces under potential control. As examples, the initial growth stages of thin silver(I) oxide layers are presented as well as changes of the near ra… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

3
29
0

Year Published

2003
2003
2017
2017

Publication Types

Select...
6
2
1

Relationship

0
9

Authors

Journals

citations
Cited by 32 publications
(32 citation statements)
references
References 19 publications
3
29
0
Order By: Relevance
“…Time resolved experiments were performed in the quick-extended X-ray absorption fine structure (QEX-AFS) mode, where the DCM is moved continuously from lower to higher energies and the absorption spectrum is measured simultaneously. 16,17 For the X-ray studies, sputter deposited silver films (thickness ³300 nm) on glass substrates were mounted in an electrochemical cell; details of this cell are given in Ref. 7.…”
Section: Methodsmentioning
confidence: 99%
“…Time resolved experiments were performed in the quick-extended X-ray absorption fine structure (QEX-AFS) mode, where the DCM is moved continuously from lower to higher energies and the absorption spectrum is measured simultaneously. 16,17 For the X-ray studies, sputter deposited silver films (thickness ³300 nm) on glass substrates were mounted in an electrochemical cell; details of this cell are given in Ref. 7.…”
Section: Methodsmentioning
confidence: 99%
“…A standard Zn foil was mounted between two ionization chambers, downstream of the sample, to allow the energy to be calibrated using the first inflection point of the Zn foil absorption edge. The XANES and EXAFS scanning step sizes were 0.5 eV/point and 1.0 eV/point, respectively (Hecht et al, 1996). According to the fundamental of SSRF, the uncertainty for XAS measurement is lower than 0.005% (5-20 keV).…”
Section: Xas Measurementsmentioning
confidence: 99%
“…The resulting compounds were characterized by X-Ray diffraction confirming the presence of cubic Ag 2 O in the first oxidation step and a mixture of Ag 2 O and AgO in the last one (see figure 2). It should be noted that AgO is not a Ag(II) phase but has been shown to contain Ag(I) and Ag(III) by means of neutron diffraction [16] and EXAFS data [17][18] .…”
Section: Resultsmentioning
confidence: 99%