Radiation and annealing related effects in NBT stressed P-channel power VDMOSFETs

Danković, Danijel; Davidović, V.; Golubović, S.; Veljković, Sandra; Mitrović, Nikola; Djorić-Veljković, S.

doi:10.1016/j.microrel.2021.114273

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Radiation and annealing related effects in NBT stressed P-channel power VDMOSFETs

Cited by 7 publications

References 33 publications

Impact of negative bias temperature instability on p-channel power VDMOSFET used in practical applications

Impact of negative bias temperature instability on p-channel power VDMOSFET used in practical applications

A meta-heuristic search-based input vector control approach to co-optimize NBTI effect, PBTI effect, and leakage power simultaneously

A comprehensive study of negative bias temperature instability in MOS structures

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