2001
DOI: 10.1016/s0040-6090(01)00961-0
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Radiation induced degradation and surface charging of organic thin films in ultraviolet photoemission spectroscopy

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Cited by 46 publications
(57 citation statements)
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“…97, 063112 ͑2010͒ optical light, thus increasing the conductivity by the creation of free charge carriers. 21 This effect is seen in the data of Figs. 3͑a͒ and 3͑c͒.…”
Section: -2mentioning
confidence: 70%
“…97, 063112 ͑2010͒ optical light, thus increasing the conductivity by the creation of free charge carriers. 21 This effect is seen in the data of Figs. 3͑a͒ and 3͑c͒.…”
Section: -2mentioning
confidence: 70%
“…As described earlier [1,19], the laser power was incrementally increased until the HOMO peak position and width remained constant upon further increase in laser power. This saturation was reached here at 14 mW (nominal laser power).…”
Section: Organic Single Crystalsmentioning
confidence: 97%
“…Angle-resolved ultraviolet photoelectron spectroscopy with synchrotron radiation excitation is established as the most powerful tool for probing the energy band structure of solids. However, the band structure measurement of (single crystalline) organic semiconductors is difficult due to their low conductivity on one hand and the low tolerance of conjugated organic compounds towards beam damage on the other hand [19]. Positive charging near the surface of the organic specimen due to the photoemission process causes electric fields that distort or even suppress a meaningful photoemission spectrum.…”
Section: Introductionmentioning
confidence: 99%
“…From conjugated -electron systems such irradiation effects are well known and were attributed to the generation of structural and chemical defects, i.e., bond breaking and/or cross linking. 43 These defects hinder the formation of delocalized molecular orbitals and thus affect first the corresponding states close to E F .…”
Section: Vuv-radiation-induced Surface Damagementioning
confidence: 99%