2022
DOI: 10.1007/s41614-022-00084-2
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Radical-controlled plasma processes

Abstract: In plasmas, a variety of radicals which are defined as electrically neutral radicals in this article are efficiently produced by collisions between electrons and gas molecules. These radicals can subsequently undergo gas phase reactions with solids, liquids and living organisms that result in non-equilibrium surface/interface physicochemical processes. The specific phenomena produced by these reactions remain largely unknown, even though these plasma-based processes could lead to disruptive technological innov… Show more

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Cited by 25 publications
(14 citation statements)
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“…Based on the presented results, the following facts can be summarized: (1) In conventional reactive ion etching, it is widely recognized that the etching process of dielectric materials is complex and involves interactions between the film being etched and ions/ radicals. 41 This process is influenced by various factors. When the substrate is exposed to plasma with a high bias voltage, ions are regarded as the primary etchants, exhibiting a higher etching yield for dielectric materials with high bonding energy.…”
Section: ■ Etching Model and Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…Based on the presented results, the following facts can be summarized: (1) In conventional reactive ion etching, it is widely recognized that the etching process of dielectric materials is complex and involves interactions between the film being etched and ions/ radicals. 41 This process is influenced by various factors. When the substrate is exposed to plasma with a high bias voltage, ions are regarded as the primary etchants, exhibiting a higher etching yield for dielectric materials with high bonding energy.…”
Section: ■ Etching Model and Discussionmentioning
confidence: 99%
“…Simultaneously, in the CF 4 /H 2 plasmas, the CH x F y ions, which act as the primary etchants, can decompose the AFS into SiF 4 and NH 3 or other volatile products, e.g., HCN, via reactive sputtering. Nevertheless, the presence of CH x F y ions and their radicals in the etching processes of SiN using hydrogen-containing fluorocarbon plasmas introduces additional complexity to the reactions, 41 in contrast to the relatively simpler etching process observed in the HF/H 2 plasma. It is plausible that the CH x F y ions have a higher propensity to decompose the AFS phase, supported by XPS, as shown in Figure 4b.…”
Section: ■ Etching Model and Discussionmentioning
confidence: 99%
“…Topical collection "Plasma Innovation Lecture (PI)" is lecture series of Plasma Innovation Prize laureates and first article is published in 2022 (Hori 2022).…”
Section: Volume 6 Publicationmentioning
confidence: 99%
“…10,11 In such a plasma, only electrons are at high temperature, while the ions and radicals stay at a much lower temperature, such as in the order of several hundred kelvins. [12][13][14][15] Moreover, plasma functionalization has another advantage over CNT functionalization in that direct functionalization is possible on the CNT surface.…”
Section: Introductionmentioning
confidence: 99%
“…However, once the nanotubes are exposed to plasma, the opportunity to functionalize CNTs increases because plasma contains a lot of energetic species, 9 especially low‐temperature plasma has an advantage in that the processing temperature could remain low 10,11 . In such a plasma, only electrons are at high temperature, while the ions and radicals stay at a much lower temperature, such as in the order of several hundred kelvins 12–15 . Moreover, plasma functionalization has another advantage over CNT functionalization in that direct functionalization is possible on the CNT surface.…”
Section: Introductionmentioning
confidence: 99%