“…Simultaneously, in the CF 4 /H 2 plasmas, the CH x F y ions, which act as the primary etchants, can decompose the AFS into SiF 4 and NH 3 or other volatile products, e.g., HCN, via reactive sputtering. Nevertheless, the presence of CH x F y ions and their radicals in the etching processes of SiN using hydrogen-containing fluorocarbon plasmas introduces additional complexity to the reactions, 41 in contrast to the relatively simpler etching process observed in the HF/H 2 plasma. It is plausible that the CH x F y ions have a higher propensity to decompose the AFS phase, supported by XPS, as shown in Figure 4b.…”