“…The average FWHM of all indexed Laue peaks in angular space is taken to describe the diffraction peak shape. With these powerful software packages, mXRD has been applied to the investigation of phase identification and structural evolution of micro-/nanocrystals (Guo et al, 2011;Strelcov et al, 2012;Dejoie et al, 2014), orientation mapping of single-or polycrystalline materials (Chen et al, 2010;Ma et al, 2015), transient and residual strain/stress measurement in engineering and natural materials (Chen et al, 2009(Chen et al, , 2015(Chen et al, , 2020Li, Xie et al, 2018), and evaluation of dislocation type, arrangement and density by analyzing the Laue peak shape (Lupinacci et al, 2015;. In these typical applications of the mXRD technique, it is found that the functionalities, such as 2D map plotting, misorientation computing, grain boundary characterization and strain/stress distribution visualization, need to be further enhanced for general users.…”