2014
DOI: 10.1016/j.jnoncrysol.2014.07.013
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Raman spectroscopic investigation of boron doped hydrogenated amorphous silicon thin films

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Cited by 10 publications
(3 citation statements)
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“…However, the FWHM of TO mode and Δθ B slightly increase with increase in MFR due to incorporation of additional carbon atoms bonded with Si, which increases the bond angle deviation. These FWHM and Δθ B values are comparable with other reported works in literature [26].…”
Section: Ramansupporting
confidence: 92%
“…However, the FWHM of TO mode and Δθ B slightly increase with increase in MFR due to incorporation of additional carbon atoms bonded with Si, which increases the bond angle deviation. These FWHM and Δθ B values are comparable with other reported works in literature [26].…”
Section: Ramansupporting
confidence: 92%
“…Поэтому характер изменения проводимости связан, по-видимому, с изменением способа, которым атомы бора встраиваются в структуру кремниевой пленки. При увеличении концентрации бора помимо связей B−Si происходит образование за счет пассивации бора водородом электрических нейтральных групп B−H и B−H−Si [21], что приводит к снижению проводимости легированных пленок кремния.…”
Section: результаты эксперимента и обсуждениеunclassified
“…However, a detailed comparison between the spectra for the p-doped S1 sample and intrinsic P ones, grown, as we recall at a somewhat higher temperature, showed that boron present in S1 led to the decrease of both the short and medium range crystalline order. The latter can be elucidated based on [19], by noting that the TO mode in S1 was wider and the TA-to-TO mode Table 1. Deposition conditions and measured index and band gap of a-Si films used in this study.…”
Section: Sample Fabrication and Femtosecond Optical Pump-probe Measur...mentioning
confidence: 99%