"Ramp Differentiation" C(V) Measurement of MOS Structures for Thermally Grown Oxide Quality Analysis

Mitchell, C.K.; Schmitz, Ronald J.

doi:10.1109/te.1971.4320657

IEEE Trans. Educ.

1971

DOI: 10.1109/te.1971.4320657

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"Ramp Differentiation" C(V) Measurement of MOS Structures for Thermally Grown Oxide Quality Analysis

C.K. Mitchell

Ronald J. Schmitz

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"Ramp Differentiation" C(V) Measurement of MOS Structures for Thermally Grown Oxide Quality Analysis

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