Rapid and Easy Detection of Deoxynivalenol on a Bismuth Oxide Screen‐printed Electrode

Abstract

In this work we propose a rapid method for deoxynivalenol (DON) detection based on the differential pulse voltammetric (DPV) response of this mycotoxin on a bismuth oxide modified screen‐printed electrode (SPE). In alkaline media the reduction peak of Bi2O3 is modified and an additional peak at a more negative potential is observed due to the DON presence in solution. The experimental conditions and DPV instrumental parameters have been optimized in order to get adequate responses for DON analysis on the BiOx‐SPE devices. The best results are obtained in 0.10 mol L−1 KOH using a 60 mV s−1 scan rate and 40 mV pulse amplitude. The ratio of the DON peak current to the Bi(III) reduction peak current is used for quantification purposes of this mycotoxin. Two linear response ranges (r values >0.99) with a sensitivity of 0.0019 L μg−1 (5.5×105 L mol−1) in the lower concentration range have been obtained at these measurement conditions. The reproducibility of the method is adequate, with RSD values lower than 10 % using different SPE devices for each measurement. The LOD and LOQ values (7.1 μg L−1, 2.4×10−8 mol L−1 and 24 μg L−1, 8.1×10−8 mol L−1 respectively) permit to determine DON with adequate precision and accuracy at low concentration levels. These good analytical features and the disposable and economical devices and the portable and simple instrumentation used for the measurements could make possible the implementation of this methodology for the in‐situ determination of DON.

Zeolitic Imidazolate Framework-8 Composite-Based Enzyme-Linked Aptamer Assay for the Sensitive Detection of Deoxynivalenol

“…Table S1: Sequence information of the oligonucleotides used in this work; Table S2: Comparison of different methods for DON detection; Table S3: Detection of DON in actual samples by the proposed ELAA method; and Table S4: Comparison of the detection limit and cost between ELISA and the proposed ELAA method. References [ 39 , 40 , 41 , 42 , 43 , 44 , 45 ] are cited in Supplementary Materials.…”