2001
DOI: 10.1016/s0003-2670(00)01285-x
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Rapid and simple technique for the determination of the refractive index of ultra-thin organic films on planar transparent substrates using forward light scatter

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Cited by 8 publications
(2 citation statements)
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“…For the DNA submonolayers used in this study, probe and target coverages were determined by fixing the dielectric constant of the layer (ɛ layer ) at a value of 2.0 ( 19 ). Angularly dependent light scattering and ellipsometry studies have reported differences in ɛ layer of 0.06–0.2 for ssDNA and dsDNA films ( 23 , 24 ). Our assumption of a single value of ɛ layer for all probes with varying degrees of secondary structure, therefore, can cause at most 3% error in our coverage calculations.…”
Section: Methodsmentioning
confidence: 99%
“…For the DNA submonolayers used in this study, probe and target coverages were determined by fixing the dielectric constant of the layer (ɛ layer ) at a value of 2.0 ( 19 ). Angularly dependent light scattering and ellipsometry studies have reported differences in ɛ layer of 0.06–0.2 for ssDNA and dsDNA films ( 23 , 24 ). Our assumption of a single value of ɛ layer for all probes with varying degrees of secondary structure, therefore, can cause at most 3% error in our coverage calculations.…”
Section: Methodsmentioning
confidence: 99%
“…An extensive body of literature related to the fabrication and characterization of OTCE is currently available. However, most of these studies have focused on either the optical (mostly in the visible region of the electromagnetic spectrum) or electrochemical properties of OTCE.…”
Section: Introductionmentioning
confidence: 99%