2024
DOI: 10.1016/j.microc.2024.110698
|View full text |Cite
|
Sign up to set email alerts
|

Rapid detection of turtle cracks in corn seed based on reflected and transmitted images combined with deep learning method

He Li,
Yun Hao,
Weifeng Wu
et al.
Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2024
2024
2024
2024

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
references
References 24 publications
0
0
0
Order By: Relevance