Reflection high-energy electron diffraction (RHEED) is
a powerful
tool in molecular beam epitaxy (MBE), but RHEED images are often difficult
to interpret, requiring experienced operators. We present an approach
for automated surveillance of GaAs substrate deoxidation in MBE reactors
using deep-learning-based RHEED image-sequence classification. Our
approach consists of an nonsupervised autoencoder (AE) for feature
extraction, combined with a supervised convolutional classifier network.
We demonstrate that our lightweight network model can accurately identify
the exact deoxidation moment. Furthermore, we show that the approach
is very robust and allows accurate deoxidation detection for months
without requiring retraining. The main advantage of the approach is
that it can be applied to raw RHEED images without requiring further
information such as the rotation angle, temperature, etc.