Rapid quasi non-destructive 3D chemical visualization with tabletop x-ray laser mass spectrometry

Abstract

Laser ablation in combination with mass spectromety is a well established methodology to probe chemical composition of a variety of materials, including refractory materials. While using plasma-driven XUV lasers, the drastic reduction of sampled volume is not accompanied by a reduction in sensitivity, which indicates an enhancement of the sample utilization efficiency using XUV. A capillary discharge Ne-like Ar laser operating 46.9nm was utilized demonstrating unprecedented insights. The rapid direct and absolute characterization in 3D of the elemental distribution using XUV laser-time-offlight (TOF) mass spectrometry is shown here in the case of solar thin films. Elements such as suphur, zinc and selenium showed similar layered concentration, while sodium, calcium, and silicon may have diffused from the soda-lime glass substrate. Lithium was doped, and is responsible for the development of a granular porous fabric.