“…In acknowledgement of this challenge, researchers have sought to develop methods that are able to detect, quantify, and evaluate the nature of the defects in different UiO-66 samples, preferably with routine characterization techniques available in most home labs. To this end, most research groups (including our own) employ some combination of PXRD 37,49,52,54,73 , TGA 37,49,50,[53][54][55]58,61,68,69,73 , dissolution/ 1 H NMR spectroscopy 37,47,49,53,59,69 , and N2 adsorption measurements 37,38,[47][48][49]53,58,59,61,63,68,69,73 (sometimes in conjunction with simulations 37,49,61,67,73 ). While indirect, this approach has proven to be valuable for detecting defects and assessing their concentration via simple semi-quantitative data analysis methods 37,49 .…”