2022
DOI: 10.1016/j.cap.2021.08.010
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Rational design of porous NiCo2S4 nanotubes for hybrid supercapacitor

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Cited by 17 publications
(2 citation statements)
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“…Figure a shows the homogeneous morphology of NiCo 2 S 4 nanosheets, while the lattice stripe information on the typical (311) crystallographic planes of NiCo 2 S 4 nanosheets with a pitch of 0.271 nm can be observed by the high-resolution TEM (HRTEM) image in Figure b . Furthermore, the selected-area electron diffraction (SAED) image is illustrated in Figure c, clearly labeling the positions of the diffraction rings corresponding to the (311), (444), and (531) crystallographic planes of the NiCo 2 S 4 nanosheets. , Through the analysis of the elemental distribution of NiCo 2 S 4 nanosheets, the distribution of Ni, Co, and S elements can be precisely distinguished (as shown in Figure d–f). Further characterization was conducted by atomic force microscopy (AFM), as shown in Figure g,h.…”
Section: Resultsmentioning
confidence: 93%
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“…Figure a shows the homogeneous morphology of NiCo 2 S 4 nanosheets, while the lattice stripe information on the typical (311) crystallographic planes of NiCo 2 S 4 nanosheets with a pitch of 0.271 nm can be observed by the high-resolution TEM (HRTEM) image in Figure b . Furthermore, the selected-area electron diffraction (SAED) image is illustrated in Figure c, clearly labeling the positions of the diffraction rings corresponding to the (311), (444), and (531) crystallographic planes of the NiCo 2 S 4 nanosheets. , Through the analysis of the elemental distribution of NiCo 2 S 4 nanosheets, the distribution of Ni, Co, and S elements can be precisely distinguished (as shown in Figure d–f). Further characterization was conducted by atomic force microscopy (AFM), as shown in Figure g,h.…”
Section: Resultsmentioning
confidence: 93%
“…23 nanosheets. 24,25 Through the analysis of the elemental distribution of NiCo 2 S 4 nanosheets, the distribution of Ni, Co, and S elements can be precisely distinguished (as shown in Figure 2d−f). Further characterization was conducted by atomic force microscopy (AFM), as shown in Figure 2g,h.…”
Section: ■ Introductionmentioning
confidence: 99%