2007
DOI: 10.1021/nl071168m
|View full text |Cite
|
Sign up to set email alerts
|

Rayleigh Imaging of Graphene and Graphene Layers

Abstract: We investigate graphene and graphene layers on different substrates by monochromatic and white-light confocal Rayleigh scattering microscopy. The image contrast depends sensitively on the dielectric properties of the sample as well as the substrate geometry and can be described quantitatively using the complex refractive index of bulk graphite. For a few layers (<6), the monochromatic contrast increases linearly with thickness. The data can be adequately understood by considering the samples behaving as a supe… Show more

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

17
623
1
3

Year Published

2008
2008
2020
2020

Publication Types

Select...
5
4

Relationship

2
7

Authors

Journals

citations
Cited by 644 publications
(644 citation statements)
references
References 38 publications
17
623
1
3
Order By: Relevance
“…Figure 4 shows the G band Raman intensity of graphene sheets on a 300 nm SiO 2 /Si substrate as a function of the number of layers [40]. The number of layers of graphene sheets is determined by Raman and contrast spectroscopy [44,46,47]. In addition to the graphene sheets with one, two, three, five, six, eight, and nine layers, samples a h have more than 10 layers, with thickness in the range ~5 nm (sample a) to ~50 nm (sample h), as determined by AFM.…”
Section: Interference Enhancement Of Graphene On a Sio 2 /Si Substratementioning
confidence: 99%
See 1 more Smart Citation
“…Figure 4 shows the G band Raman intensity of graphene sheets on a 300 nm SiO 2 /Si substrate as a function of the number of layers [40]. The number of layers of graphene sheets is determined by Raman and contrast spectroscopy [44,46,47]. In addition to the graphene sheets with one, two, three, five, six, eight, and nine layers, samples a h have more than 10 layers, with thickness in the range ~5 nm (sample a) to ~50 nm (sample h), as determined by AFM.…”
Section: Interference Enhancement Of Graphene On a Sio 2 /Si Substratementioning
confidence: 99%
“…Multi-reflection/interference effects on contrast have been well documented in the literature but the multiple reflection of Raman signals has not [44,46,47]. By considering the multilayer interference of incident light as well as the multi-reflection of Raman signals in graphene/graphite based on Fresnel's equations, the above Raman results can be explained.…”
Section: Interference Enhancement Of Graphene On a Sio 2 /Si Substratementioning
confidence: 99%
“…n 1 = n 3 = n) we find A = N πα/n = 2.3/n%. These equations are valid for N¡10 [27,76,83]. For N > 10 the thin film limit breaks down and the optical paths inside the film must be taken into account.…”
Section: Slg Absorption In the Thin Film Limitmentioning
confidence: 99%
“…Due to the internal exceptionally high crystal quality [8,9] and massless Dirac fermions [10], monolayer graphene exhibits anomalous half integer quantum Hall effect [11], remarkable optical properties [12,13], ultra-high intrinsic strength [14], superior thermal conductivity [15] and extremely high charge carrier mobility [6,16,17]. It is referred to as a zero-gap semiconductor, showing an exceptionally high concentration of charge carriers and ballistic transport because of the unique Dirac cone band structure near the Fermi level.…”
Section: Introductionmentioning
confidence: 99%