1998
DOI: 10.1016/s0169-4332(97)00383-8
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RBS-ERDA, XPS and XRD characterizations of PECVD tungsten nitride films

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Cited by 21 publications
(12 citation statements)
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“…Various techniques have been employed for the synthesis of tungsten nitride films such as pulsed laser depositions (14), reactive magnetron sputtering (12,15), atomic layer *Corresponding author. Email: ahussnainsyed@gmail.com deposition (16), physical vapor deposition (17,18), and plasma enhanced chemical vapor deposition (18). We employed plasma focus device for deposition of tungsten nitride thin films on silicon substrate at room temperature by different deposition shots.…”
Section: Introductionmentioning
confidence: 99%
“…Various techniques have been employed for the synthesis of tungsten nitride films such as pulsed laser depositions (14), reactive magnetron sputtering (12,15), atomic layer *Corresponding author. Email: ahussnainsyed@gmail.com deposition (16), physical vapor deposition (17,18), and plasma enhanced chemical vapor deposition (18). We employed plasma focus device for deposition of tungsten nitride thin films on silicon substrate at room temperature by different deposition shots.…”
Section: Introductionmentioning
confidence: 99%
“…The N 1s spectra confirm that the WN x is partially oxidized; the deconvoluted spectra indicate that two species are present (BEs 400.2 and 401.6 eV). These BEs are higher than those for unoxidized WN x (N1s 397 eV)65 and are assigned to oxidized WN x . The O 1s spectra also suggest that oxygen is bound to W (BE = 530.3 eV)67 and also to C (BE = 532 eV)66 present in the deposited material (see Supporting Information).…”
Section: Resultsmentioning
confidence: 67%
“…The sum of the bond angles around N2/ N2A (359.97°) and N3 (359.96°) in compound 1 is essentially 360°, which indicates sp 2 hybridization of the amide nitrogen atoms. These www.eurjic.org BEs are higher than those for unoxidized WN x (N1s 397 eV) [65] and are assigned to oxidized WN x . The deviation from tetrahedral geometry found in 1 is manifested in the expansion of the N2-W1-N3/N2A-W1-N3/N2A-W1-N2 bond angles (11)°] relative to 109.5°.…”
Section: Resultsmentioning
confidence: 83%
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