2013
DOI: 10.1021/nl400844a
|View full text |Cite
|
Sign up to set email alerts
|

Reaching the Theoretical Resonance Quality Factor Limit in Coaxial Plasmonic Nanoresonators Fabricated by Helium Ion Lithography

Abstract: Optical antenna structures have revolutionized the field of nano-optics by confining light to deep subwavelength dimensions for spectroscopy and sensing. In this work, we fabricated coaxial optical antennae with sub-10-nanometer critical dimensions using helium ion lithography (HIL). Wavelength dependent transmission measurements were used to determine the wavelength-dependent optical response. The quality factor of 11 achieved with our HIL fabricated structures matched the theoretically predicted quality fact… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

5
103
0

Year Published

2016
2016
2023
2023

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 111 publications
(108 citation statements)
references
References 50 publications
5
103
0
Order By: Relevance
“…He þ exposure alone produces the typical subsurface damage which extends several hundreds of nanometers. This region is characterized by high defect density as well as amorphization of 40 using Ga þ and He þ , respectively. Milling doses were selected to achieve optimal resolution with each ion species.…”
Section: -4 Stanford Et Almentioning
confidence: 99%
“…He þ exposure alone produces the typical subsurface damage which extends several hundreds of nanometers. This region is characterized by high defect density as well as amorphization of 40 using Ga þ and He þ , respectively. Milling doses were selected to achieve optimal resolution with each ion species.…”
Section: -4 Stanford Et Almentioning
confidence: 99%
“…23 Focused ion beam (FIB) milling is a technique often used to achieve narrow-gap plasmonic aperture devices. For example, Ga þ -FIB has been used to fabricate coaxial 24 and bowtie 25 apertures with gap sizes down to 30 nm. However, realizing smaller gaps can be challenging due to the finite ion beam size and ion-substrate interaction.…”
mentioning
confidence: 99%
“…However, realizing smaller gaps can be challenging due to the finite ion beam size and ion-substrate interaction. 24 Recently, researchers have used milling-based He þ -ion lithography (HIL) to produce apertures with even smaller gap sizes, down to 8 nm in coaxial shapes 24 and 5 nm in dimers. [26][27][28] HIL provides better spatial resolution and lateral smoothness than Ga þ based FIB.…”
mentioning
confidence: 99%
See 2 more Smart Citations