2003
DOI: 10.1016/s0040-6090(03)00678-3
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Reactive electron beam evaporation of gadolinium oxide optical thin films for ultraviolet and deep ultraviolet laser wavelengths

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Cited by 56 publications
(39 citation statements)
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“…The direct E g values were found to be 5.56, 5.12 and 5.04 eV for the Gd(OH) 3 , GdOOH and Gd 2 O 3 nanorods, respectively (Figures 4 (a)). These values agree with those reported in the literature as compared to bulk band gap values 33,34 . Some small variations are attributed to the fact that the E g values depend on the method of preparation and the experimental conditions like the type of surfactant, temperature and processing time.…”
Section: Resultssupporting
confidence: 92%
“…The direct E g values were found to be 5.56, 5.12 and 5.04 eV for the Gd(OH) 3 , GdOOH and Gd 2 O 3 nanorods, respectively (Figures 4 (a)). These values agree with those reported in the literature as compared to bulk band gap values 33,34 . Some small variations are attributed to the fact that the E g values depend on the method of preparation and the experimental conditions like the type of surfactant, temperature and processing time.…”
Section: Resultssupporting
confidence: 92%
“…8. The PSD dependences on frequency are similar to those typically obtained for the samples in which thin layers are deposited on smooth substrate [32][33][34][35]. It was shown in [35] that PSD of a thin film coating can be described by a sum of PSD of the substrate and the PSD of the pure film.…”
Section: Discussionsupporting
confidence: 77%
“…It was demonstrated in various studies [32][33][34] that some features of the surfaces structures can be described by parameters of the power spectral density (PSD) function derived from the AFM surface profile data.…”
Section: Discussionmentioning
confidence: 99%
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