2019
DOI: 10.1002/rcm.8500
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Real divisors and pseudo‐continuous enhancement of resolution for a Kendrick mass defect analysis

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Cited by 7 publications
(8 citation statements)
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“…Pyrolysis-GC/MS profiles composed of 3480 scans were exported as netCDF files using the proprietary program msAxel (JEOL, Japan), which was also used for the control of the instrument. The netCDF files were imported to the freeware Kendo (AIST, Japan) written with Visual Studio (Microsoft, USA) for the processing and visualization of mass spectral data. , All the files were first thresholded at 1000 counts (average background signal from the detector before the py-GC/MS analysis) and “CF 2 -filtered” scan-by-scan to extract any peak series spaced by 49.9968 (mass of a CF 2 moiety) ±0.003 Da, which was the tolerance chosen based on the dispersion of m / z values for the peak from hexamethylcyclotrisiloxane at m / z 207.0324 over 10 min of analysis.…”
Section: Experimental Methodsmentioning
confidence: 99%
“…Pyrolysis-GC/MS profiles composed of 3480 scans were exported as netCDF files using the proprietary program msAxel (JEOL, Japan), which was also used for the control of the instrument. The netCDF files were imported to the freeware Kendo (AIST, Japan) written with Visual Studio (Microsoft, USA) for the processing and visualization of mass spectral data. , All the files were first thresholded at 1000 counts (average background signal from the detector before the py-GC/MS analysis) and “CF 2 -filtered” scan-by-scan to extract any peak series spaced by 49.9968 (mass of a CF 2 moiety) ±0.003 Da, which was the tolerance chosen based on the dispersion of m / z values for the peak from hexamethylcyclotrisiloxane at m / z 207.0324 over 10 min of analysis.…”
Section: Experimental Methodsmentioning
confidence: 99%
“…Kendrick analysis of the MALDI-MS data was performed by importing the raw data retrieved from the FlexAnalysis software into an Excel program developed at AIST (Advanced Industrial Science and Technology, Tsukuba, Japan) . The Kendrick mass (KM) values of the observed ions were calculated according to eq , in which R / x is the fractional base unit ( x ≥ 1) used to create Kendrick plots and m / z the ion’s mass-to-charge ratio. The corresponding Kendrick mass defects (KMDs) were obtained according to eq , i.e., by subtracting the KM from the nominal mass of the ion (NKM). Kendrick displays were derived by plotting Kendrick mass defect (KMD) vs m / z .…”
Section: Methodsmentioning
confidence: 99%
“…The profile spectra exported from msTornado analysis (JEOL) were turned into peak lists using mMass 5.5.0 28 (Gaussiansmoothing; window size: 0.01 m/z; peak-picking F I G U R E 1 DIUTHAME mass spectra of PEG 600 observed using the DIUTHAME chip threshold: 0.5%). The KMD plots were computed and processed from the peak lists using Kendo, 29 an in-house program.…”
Section: Kendrick Mass Defect (Kmd) Analysismentioning
confidence: 99%