2014
DOI: 10.1038/ncomms6001
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Real-space observation of unbalanced charge distribution inside a perovskite-sensitized solar cell

Abstract: Perovskite-sensitized solar cells have reached power conversion efficiencies comparable to commercially available solar cells used for example in solar farms. In contrast to silicon solar cells, perovskite-sensitized solar cells can be made by solution processes from inexpensive materials. The power conversion efficiency of these cells depends substantially on the charge transfer at interfaces. Here we use Kelvin probe force microscopy to study the real-space cross-sectional distribution of the internal potent… Show more

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Cited by 317 publications
(340 citation statements)
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“…There is also debate about how to correctly measure the recombination and transport times, the charge density, and even the correct measurement of efficiency. [5][6][7][8][9][10][11][12][13][14][15][16][17] The debate about characterization centers on the interpretation of various time constants that can be measured by optical and electrical means. These time constants range from <1 µs to >100 µs.…”
Section: Introductionmentioning
confidence: 99%
“…There is also debate about how to correctly measure the recombination and transport times, the charge density, and even the correct measurement of efficiency. [5][6][7][8][9][10][11][12][13][14][15][16][17] The debate about characterization centers on the interpretation of various time constants that can be measured by optical and electrical means. These time constants range from <1 µs to >100 µs.…”
Section: Introductionmentioning
confidence: 99%
“…KPFM was recently used to characterize the perovskite top layer [39,40] , where the presence of a small potential barrier at the grain boundaries was found. Bergmann et al have recently measured cross-sections of a complete perovskite based solar cell under illumination with KPFM and showed that the potential is similar to a p-i-n type junction [41] . Figure 5 shows CPD of line profiles recorded at pristine and additive based perovskite films which is sensitive to the surface work functions Φ of the materials.…”
Section: Kelvin Probe Force Microscopy (Kpfm)mentioning
confidence: 99%
“…Furthermore, methods such as Kelvin probe force microscopy (KPFM) [148,149] and electron-beam-induced current (EBIC) measurements [150,151] allowed for the measurement of the potential and current distribution within a device, providing more direct evidence for a charge trapping and detrapping process. In these experiments, the charge-carrier-density distribution across the cross-section of the device was measured, allowing one to track the evolution of accumulated charges after illumination.…”
Section: Wwwadvancedsciencenewscommentioning
confidence: 99%