Real-time 3D visualization and quantitative analysis of internal structure of wheat kernels

Suresh, Anup; Neethirajan, Suresh

doi:10.1016/j.jcs.2015.03.006

Cited by 28 publications

(20 citation statements)

References 21 publications

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“…Significant changes were observed along PCA length 1 than in the PCA length 2 and 3. The PCA length 1 variability in fresh grains was 18.28 μm, which increased to 30.221 μm and 43.167 μm for the 180 and 225 days of storage . The greatest variability was obtained in PCA length 1 scores followed by length 2 and 3 scores due to higher surface level infestation in rice grains on the x axis than on the y and z axes.…”

Section: Resultsmentioning

confidence: 92%

“…Image texture analysis has used for characterization of bread, to discriminate bread crumb, for classification of potato chips, in a dehydration study of apple, in discrimination of cereals, and in classification of bovine meat . X‐ray micro computed tomography (CT) is a robust approach that works at high resolution for the discrimination of the internal microstructure of food products . It offers peculiar insights due to its ability to disclose the internal structure of food non‐destructively, so that changes occurring in the structure of food over time can be monitored.…”

Section: Introductionmentioning

confidence: 99%

“…In the field of food science, X‐ray micro CT has found wide application, as summarized by Schoeman et al . In cereals it has been used for the determination of the density and volume of the maize, 3D visualization of damage to wheat kernel internal structure by insect infestation and sprouting, rice strain characterization by differences in distribution of pore size, heating effects on rice kernels, and effects of roasting on the microstructure of wheat and maize …”

Section: Introductionmentioning

confidence: 99%

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Application of an expert system of X‐ ray micro computed tomography imaging for identification of Sitophilus oryzae infestation in stored rice grains

Srivastava

Mishra

2019

Pest Management Science

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BACKGROUND The plausibility of image texture analysis to assess X‐ray images of S. oryzae‐infested rice after variable storage days (fresh, 45, 90, 135, 180 and 225 days) was investigated using an X‐ray micro computed tomography instrument. Subsequently, image acquisition, pre‐processing, and the extraction of the image textural features was done using volume graphics VGL 2.2 software. Morphological features (radius, diameter, volume, compactness, sphericity, defect volume, and voids) were extracted from the x, y, and z views of the rice grain and used as inputs for principal component analysis (PCA). RESULTS Clear grouping was observed between the fresh, 45 and 225‐day‐old S. oryzae‐infested rice grains with a classification accuracy of 88.34%. The voids (884 248.53 μm3) and defect volume distribution (137 428.04 μm3) were found to be the maximum in 225‐day‐old samples. The similarity or the distance indices values between fresh and 255‐day‐old S. oryzae‐infested rice samples were found to be 35 038.08, which resulted in clear discrimination between different storage days in S. oryzae‐infested rice grains. CONCLUSION This work contributes to the potential use of image texture analysis to aid in distinguishing S. oryzae‐infested rice grains from fresh rice grains. © 2019 Society of Chemical Industry

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Section: Resultsmentioning

confidence: 92%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Application of an expert system of X‐ ray micro computed tomography imaging for identification of Sitophilus oryzae infestation in stored rice grains

Srivastava

Mishra

2019

Pest Management Science

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“…In addition, X‐ray systems have an obvious effect on the detection of insect infestation. The internal features of wheat grains with the insect infestation or sprouting could be investigated with X‐ray CT technology for 3D visualization and quantification analysis (Figure ) (Suresh & Neethirajan, ). Karunakaran et al.…”

Section: X‐ray Ct Application On Agricultural Productsmentioning

confidence: 99%

“…3D visualizations of wheat grain (Suresh & Neethirajan, ). (a) Vertical cross section of insect‐infected wheat grain; (b) horizontal cross section of sprout‐damaged wheat grain; (c) region of interest in the insect‐infected wheat grain alongside its ortho‐projection…”

Section: X‐ray Ct Application On Agricultural Productsmentioning

confidence: 99%

X‐ray computed tomography for quality inspection of agricultural products: A review

Buttar

et al. 2019

Food Science & Nutrition

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The quality of agricultural products relates to the internal structure, which has long been a matter of interest in agricultural scientists. However, inspection methods of the opaque nature of internal information on agricultural products are usually destructive and require sample separation or preparation. X‐ray computed tomography (X‐ray CT) technology is one of the important nondestructive testing (NDT) technologies without sample separation and preparation. In this study, X‐ray CT technology is used to obtain two‐dimensional slice images and three‐dimensional tomographic images of samples. The purpose of the review was to provide an overview of the working principle of X‐ray CT technology, image processing, and analysis. This review aims to focus on the development of the agricultural products (e.g., wheat, maize, rice, apple, beef) and its applications (e.g., internal quality evaluation, microstructure observation, mechanical property measurement, and others) using CT scanner. This paper covers the aspects regarding the advantages and disadvantages of NDT technology, especially the unique advantages and limitations of X‐ray CT technology on the quality inspection of agricultural products. Future prospects of X‐ray CT technology are also put forward to become indispensable to the quality evaluation and product development on agricultural products.

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Facilely Fabricated Bright Lead‐Free Perovskite Cs₃Cu₂I₅ Scintillator Film for High‐Definition X‐Ray Imaging

Zhao

Ran

Chen

et al. 2022

Advanced Photonics Research

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Scintillator is a critical component to detect high‐energy particles or rays, which is widely used in deep space exploration, security inspection, and nondestructive testing and medical diagnosis, such as X‐ray imaging and computed tomography (CT). However, the wider application of traditional inorganic and organic scintillators is limited by the complex operation process or poor adaptability to changeable environment, and there remains a demand to develop green and stable scintillators with high sensitivity and low detection limit. Herein, the one‐step preparation of lead‐free perovskite Cs3Cu2I5 scintillator film for high‐definition X‐ray imaging by conventional chemical vapor deposition method is reported. Cs3Cu2I5 demonstrates good stability and bright‐blue emission at 445 nm and superhigh photoluminescence quantum yield (85.14%). Importantly, upon X‐ray irradiation, the Cs3Cu2I5 perovskite film exhibits light yield (≈39 251 photons MeV−1) as high as two times of the commercially available Ce:LuAG single‐crystal scintillator (≈22 000 photons MeV−1). Furthermore, the practical demonstration for a bamboo stick and insect specimens illustrates sensitive scintillation response to X‐ray signals with superior linearity and high‐quality images in X‐ray photography and CT. Overall, Cs3Cu2I5 film provides nontoxicity, high radioluminescence intensity, and good stability, it can be regarded as a competitive material for X‐ray imaging.

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Real-time 3D visualization and quantitative analysis of internal structure of wheat kernels

Cited by 28 publications

References 21 publications

Application of an expert system of X‐ ray micro computed tomography imaging for identification of Sitophilus oryzae infestation in stored rice grains

Application of an expert system of X‐ ray micro computed tomography imaging for identification of Sitophilus oryzae infestation in stored rice grains

X‐ray computed tomography for quality inspection of agricultural products: A review

Facilely Fabricated Bright Lead‐Free Perovskite Cs₃Cu₂I₅ Scintillator Film for High‐Definition X‐Ray Imaging

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Real-time 3D visualization and quantitative analysis of internal structure of wheat kernels

Cited by 28 publications

References 21 publications

Application of an expert system of X‐ ray micro computed tomography imaging for identification of Sitophilus oryzae infestation in stored rice grains

Application of an expert system of X‐ ray micro computed tomography imaging for identification of Sitophilus oryzae infestation in stored rice grains

X‐ray computed tomography for quality inspection of agricultural products: A review

Facilely Fabricated Bright Lead‐Free Perovskite Cs3Cu2I5 Scintillator Film for High‐Definition X‐Ray Imaging

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Product

Resources

About

Facilely Fabricated Bright Lead‐Free Perovskite Cs₃Cu₂I₅ Scintillator Film for High‐Definition X‐Ray Imaging