Real-Time Automatic Defect Inspection of PCTP ITO Circuits Using a 1-D Image Comparison Algorithm

Jiang, Changcheng; Quan, Yanming; Lin, Xingui

doi:10.14257/ijsip.2017.10.1.19

IJSIP

2017

DOI: 10.14257/ijsip.2017.10.1.19

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Real-Time Automatic Defect Inspection of PCTP ITO Circuits Using a 1-D Image Comparison Algorithm

Changcheng Jiang¹,

Yanming Quan²,

Xingui Lin³

Abstract: Abstract

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Real-Time Automatic Defect Inspection of PCTP ITO Circuits Using a 1-D Image Comparison Algorithm

Abstract: Abstract

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References 5 publications

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