Real-Time Average Junction Temperature Estimation for Multichip IGBT Modules With Low Computational Cost

Guo, Weisheng; Ma, Mingyao; Wang, Hai; Xiang, Nianwen; Wang, Hanyu; Chen, Zhaoxiang; Chen, Wenjie

doi:10.1109/tie.2022.3176284

Cited by 21 publications

(3 citation statements)

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“…One of the important research perspectives is to investigate the thermal transient responses. The typical applications are such as to obtain the thermal model parameters [5], [6], identify the inner structure [7], [8], analyze failure modes non-destructively [9], and estimate the junction temperature [10]- [12].…”

Section: Introductionmentioning

confidence: 99%

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A Novel Evaluation Method of Thermal Transient Measurement by Regularization

Zhang¹,

Evgrafov²,

Zhao³

2022

Preprint

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<p>In this paper we propose a new evaluation method for revealing the inner structure information from the measurements of the thermal transient response of semiconductor devices. In contrast with the conventional methods based on the frequency domain deconvolution, the proposed method casts the problem as a regularized least squares problem for an integral equation directly in the time domain. The regularization is selected based on the knowledge of certain physical quantities involved in the measurement. We observe that the thermal time constant spectrum produced by the proposed method tends to have a better capability of identifying two adjacent parameters. With the benchmark of the true values of the thermal networks, the structure function of the proposed method reduces the relative error by an order of magnitude. A series of simulations based on different parameters and structures verify the viability and performance of the proposed method. A proof-of-concept experiment based on a commercial power semiconductor device also validates the effectiveness of the proposed method.</p>

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Section: Introductionmentioning

confidence: 99%

“…method, the framework of the NID method has been successfully standardized in [17] and commercialized in [18]. The majority of publications about the NID method are focused on a variety of its applications [5], [6], [9], [10], [14]. The limitations or challenges of the method itself are rarely discussed.…”

Section: Introductionmentioning

confidence: 99%

A Novel Evaluation Method of Thermal Transient Measurement by Regularization

Zhang¹,

Evgrafov²,

Zhao³

2022

Preprint

View full text Add to dashboard Cite

show abstract

“…There is a serious need for fast and easily implementable thermal model. A computationally fast 2D average thermal model is proposed in [44]. However, several factors limit this method such as neglecting thermal coupling in critical layers and module-to-module thermal coupling and the impact of TIM and integrated heat sink.…”

Section: Introductionmentioning

confidence: 99%